High-Selectivity Single-Chip Spectrometer in Silicon for Operation at Visible Part of the Spectrum

A microspectrometer has been realized based on an array of Fabry--Perot optical thin-film filters. The 16-channel microspectrometer is compatible with IC fabrication methods and operates in the visible spectral range with an interchannel shift of 6 nm. Each of the channels is sensitive in a single peak with full-width-half-maximum (FWHM) of 16 nm. Also a FWHM below 2 nm and finesse of 40 for narrow band operation is demonstrated. The device can easily be tuned during fabrication to cover a different spectral band only by adjusting the etching times without affecting the device layout. Such a device is extremely suitable for applications in microsystems because of its small size, high spectral selectivity, and low cost. Microspectrometers for the UV and IR regions are also feasible using this technique

Acquisition and monitoring system for TEG characterization

This paper presents an acquisition system for measuring and characterization of thermoelectric generators (TEGs) for energy harvesting purposes on wireless sensors networks (WSNs). This system can monitor and characterize up to three TEGs simultaneously and is comprised of two main electronic circuits: the first one is composed of 12 input channels being three for reading voltage, three for reading current by making use of instrumentation amplifiers (ACS712), and six thermocouples for signal reading (<400∘C). The second electronic circuit consists of a proportional-integral-derivative (PID) controller with two pulse width modulation (PWM) input channels for controlling the heat (thermoresistance) and cooling (controlled cooler) sources, respectively, following a predefined temperature gradient. The TEG measured data for the voltage, current, and temperature can be acquired in real-time with an application written on Delphi language and displayed both through a numeric and graphical display. In order to validate the precision and accuracy two commercial TEG modules (inbC1-127.08HTS) compatible with temperatures up to 200∘C without signal degradation were used in series.The functional prototype of the implemented system had a cost under ≈430 USD, making it suitable where a good knowledge of the electrical characteristics of TEGs is of major interest, especially on cogeneration systems

Acquisition and monitoring system for TEG characterization

This paper presents an acquisition system for measuring and characterization of thermoelectric generators (TEGs) for energy harvesting purposes on wireless sensors networks (WSNs). This system can monitor and characterize up to three TEGs simultaneously and is comprised of two main electronic circuits: the first one is composed of 12 input channels being three for reading voltage, three for reading current by making use of instrumentation amplifiers (ACS712), and six thermocouples for signal reading (<400∘C). The second electronic circuit consists of a proportional-integral-derivative (PID) controller with two pulse width modulation (PWM) input channels for controlling the heat (thermoresistance) and cooling (controlled cooler) sources, respectively, following a predefined temperature gradient. The TEG measured data for the voltage, current, and temperature can be acquired in real-time with an application written on Delphi language and displayed both through a numeric and graphical display. In order to validate the precision and accuracy two commercial TEG modules (inbC1-127.08HTS) compatible with temperatures up to 200∘C without signal degradation were used in series.The functional prototype of the implemented system had a cost under ≈430 USD, making it suitable where a good knowledge of the electrical characteristics of TEGs is of major interest, especially on cogeneration systems

Spectral measurement using IC-compatible linear variable optical filter

This paper reports on the functional and spectral characterization of a microspectrometer based on a CMOS detector array covered by an IC-Compatible Linear Variable Optical Filter (LVOF). The Fabry-Perot LVOF is composed of 15 dielectric layers with a tapered middle cavity layer, which has been fabricated in an IC-Compatible process using resist reflow. A pattern of trenches is made in a resist layer by lithography and followed by a reflow step result in a smooth tapered resist layer. The lithography mask with the required pattern is designed by a simple geometrical model and FEM simulation of reflow process. The topography of the tapered resist layer is transferred into silicon dioxide layer by an optimized RIE process. The IC-compatible fabrication technique of such a LVOF, makes fabrication directly on a CMOS or CCD detector possible and would allow for high volume production of chip-size micro-spectrometers. The LVOF is designed to cover the 580 nm to 720 spectral range. The dimensions of the fabricated LVOF are 5×5 mm2. The LVOF is placed in front of detector chip of a commercial camera to enable characterization. An initial calibration is performed by projecting monochromatic light in the wavelength range of 580 nm to 720 nm on the LVOF and the camera. The wavelength of the monochromatic light is swept in 1 nm steps. The Illuminated stripe region on the camera detector moves as the wavelength is swept. Afterwards, a Neon lamp is used to validate the possibility of spectral measurement. The light from a Neon lamp is collimated and projected on the LVOF on the camera chip. After data acquisition a special algorithm is used to extract the spectrum of the Neon lamp