7 research outputs found

    ๊ณต์ •๋ณ€์ด๋ฅผ ๊ณ ๋ คํ•œ 3์ฐจ์› ์ง‘์  ํšŒ๋กœ ์„ค๊ณ„ ๋ฐ ํŒจํ‚ค์ง• ๊ธฐ๋ฒ•

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    ํ•™์œ„๋…ผ๋ฌธ (๋ฐ•์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ์ „๊ธฐยท์ปดํ“จํ„ฐ๊ณตํ•™๋ถ€, 2014. 2. ๊น€ํƒœํ™˜.As CMOS scaling down, The control of variation in chip performance (i.e. speed and power) becomes highly important to improve the chip yield. The increased variation of chip performance demands additional design efforts such as the increase of guard-band or longer design turnaround time (TAT), which cause degradation of both chip performance and economic profit. Meanwhile, through-silicon via (TSV) based 3D technology has been regarded as the promising solution for long interconnect wire and huge die size problem. Since a 3D IC is manufactured by stacking multiple dies which are fabricated in different wafers, integration of the dies that have far different process characteristic can enlarge the difference of device performance on different dies within a single chip. In this dissertation, we analyze the effect of on-package (within-chip) variation on 3D IC and presents effective methods to mitigate the onpackage variation. First, a parametric yield improvement method is presented to resolve the mismatches of dies having different process characteristic. Comprehensive 3D integration algorithms considering post-silicon tuning technique is developed for the multi-layered 3D IC. Then, we show that a careful clock edge embedding in 3D clock tree can greatly reduce the impact of on-package variation on 3D clock skew and propose a two-step solution for the problem of on-package variation-aware layer embedding in 3D clock tree synthesis. In summary, this dissertation presents effective 3D integration method and 3D clock tree synthesis algorithm for process-variation tolerant 3D IC designs.Abstract i Contents ii List of Figures iv List of Tables vii 1 Introduction 1 1.1 Process Variation in 3D ICs . . . . . . . . . . . . . . . . . . . . . . . 1 1.2 Contributions of This Dissertation . . . . . . . . . . . . . . . . . . . 6 2 Post-silicon Tuning Aware Die/WaferMatching Algorithms for Enhancing Parametric Yield of 3D IC Design 7 2.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.2 Preliminaries . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 2.3 The Die-to-Die Matching Problem and Proposed Algorithm Considering Body Biasing . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2.3.1 Motivation and Problem Definition . . . . . . . . . . . . . . 13 2.3.2 The Proposed Die-to-Die Matching Algorithm . . . . . . . . 15 2.4 TheWafer-to-Wafer Matching Problem and Proposed Algorithm Considering Body Biasing . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.4.1 Problem Definition and The Proposed Wafer-to-Wafer Matching Algorithm . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.5 Experimental Results . . . . . . . . . . . . . . . . . . . . . . . . . . 20 2.6 Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 3 Edge Layer Embedding Algorithm for Mitigating On-Package Variation in 3D Clock Tree Synthesis 32 3.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 3.2 Problem Definitions and Motivation . . . . . . . . . . . . . . . . . . 35 3.3 The Proposed Algorithm for On-Package Variation Aware Edge Embedding . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 3.3.1 Algorithm for Maximizing Layer Sharing of Edges . . . . . . 39 3.3.2 Refinement: Partial Edge Embedding on Layers . . . . . . . . 47 3.3.3 Clock Tree Routing and Buffer Insertion . . . . . . . . . . . . 49 3.4 Experimental Results . . . . . . . . . . . . . . . . . . . . . . . . . . 52 3.5 Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 4 Conclusion 64 4.1 Chapter 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64 4.2 Chapter 3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 Abstract in Korean 72Docto

    ๊ตํšŒ๋ถ„์—ด์‹œ ์žฌ์‚ฐ๊ท€์†๊ด€๊ณ„

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    ํ•™์œ„๋…ผ๋ฌธ(์„์‚ฌ) --์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› :๋ฒ•ํ•™๊ณผ,2007.Maste

    Utilization of Buffer Insertion for Timing Optimization in High-level Synthesis

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    ํ•™์œ„๋…ผ๋ฌธ(์„์‚ฌ) --์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› :์ „๊ธฐ. ์ปดํ“จํ„ฐ๊ณตํ•™๋ถ€,2009.8.Maste

    2009๋™๊ณ„ ๊ธ€๋กœ์ปฌ๋Œ€์ „ํฌ๋Ÿผ ํ•™์ˆ ์„ธ๋ฏธ๋‚˜ ๊ณ„ํš

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    โ–ก ๊ฐœย ย ย  ์š” ย โ—‹ ๋•Œ ยท ๊ณณ : 2009. 12. 2(์ˆ˜) 16:00, ย ย ย ย ย ย ย ย ย ย ย ์ถฉ๋‚จ๋ฐœ์ „์—ฐ๊ตฌ์›ํšŒ์˜์‹ค(์ถฉ๋‚จ๊ณต์ฃผ์‹œ ๊ธˆํฅ๋™ ์†Œ์žฌ) ย โ—‹ ์ฐธ์„์ธ์› : ํฌ๋ŸผํšŒ์›(ํ–‰์ •ํ•™๋ฐ•์‚ฌ๋™๋ฌธ) ๋ฐ ๊ด€๋ จ ๊ณต๋ฌด์› ๋“ฑ 50๋ช… ย โ—‹ ์ฃผย ย ย  ์ตœ : ๊ธ€๋กœ์ปฌ ๋Œ€์ „ํฌ๋Ÿผโ€ค์ถฉ๋‚จ๋ฐœ์ „์—ฐ๊ตฌ์› ย โ—‹ ์ฐจย ย ย  ๋Ÿ‰ : ์ถฉ๋‚จ๋„์ฒญ์—์„œ 45์ธ์Šนํ˜‘์กฐ ย โ—‹ ์ถœย ย ย  ๋ฐœ : ๋‹น์ผ ์˜คํ›„3์‹œ(๋Œ€์ „๋Œ€์„œ๋ฌธ์•ž์ถœ๋ฐœ โ†’ ๋Œ€์ „๋Œ€๋‘”์‚ฐ์บ ํผ์Šค๊ฒฝ์œ  โ†’ ๊ณต์ฃผ๋„์ฐฉ) ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ย ( 15 : 00 ) ย ย ย ย ย ย ย ย ย  ( 15 : 20 )ย ย ย ย ย ย ย  ( 16 : 00 )ย ย  - ์ดํ›„ ์ƒ๋žตใ€Œ๊ธ€๋กœ์ปฌ๋Œ€์ „ํฌ๋Ÿผใ€ํ•™์ˆ ์„ธ๋ฏธ๋‚˜ ๊ณ„ํš ๏ฟญ์ฃผ์ œ 1.์ง€์—ญ์‚ฌํšŒ๋ฅผ ์œ„ํ•œ ๋…น์ƒ‰์„ฑ์žฅ 2.์„ธ์ข…์‹œ ๊ฑด์„ค์„ ํ†ตํ•œ ์ถฉ๋‚จ ๋Œ€์ „ ์ƒ์ƒ ๋ฐœ์ „๋ฐฉํ–ฅ ๏ฟญ๋ฐœํ‘œ์ž ๋Œ€๋•๋Œ€ํ•™ ๋ฐ•์ƒ๋„ ๋ฐ•์‚ฌ ๋ฐฐ์žฌ๋Œ€ํ•™ (์„œ๊ตฌ์ฒญ ์ƒํ™œ์ง€์›๊ตญ์žฅ) ์žฅ์ข…ํƒœ ๋ฐ•์‚ฌ ๏ฟญ์‚ฌํšŒ์ž 1๋ถ€ ์‚ฌํšŒ์ž - ๋‚จ๊ถ๋ฐ•์‚ฌ 2๋ถ€ ํ† ๋ก ์‚ฌํšŒ์ž - ๋‚จ ์ค€๋ฐ•์‚ฌ ๏ฟญํ† ๋ก ์ž ์ด์–‘์ˆ™๋ฐ•์‚ฌ, ์†ก๊ธฐ์ˆ™๋ฐ•์‚ฌ, ๋ฐฑ๋ช…์ž๋ฐ•์‚ฌ, ์ž„ํ—Œ๊ท ๋ฐ•
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