661 research outputs found
Electron conduction through quasi-one-dimensional indium atomic wires on silicon
Electron conduction through quasi-one-dimensional (1D) indium atomic wires on
silicon (the Si(111)-4x1-In reconstruction) is clarified with the help of local
structural analysis using scanning tunneling microscopy. The reconstruction has
a conductance per square as high as 100 uS, with global conduction despite
numerous surface steps. A complete growth of indium wires up to both the
surface steps and the lithographically printed electrodes is essential for the
macroscopic transport. The system exhibits a metal-insulator transition at 130
K, consistent with a recent ultraviolet photoemission study [H. W. Yeom, S.
Takeda, E. Rotenberg, I. Matsuda, K. Horikoshi, J. Schaefer, C. M. Lee, S. D.
Kevan, T. Ohta, T. Nagao, and S. Hasegawa, Phys. Rev. Lett. 82, 4898 (1999)]Comment: 4 pages, 3 figure
Phase transition of the Si(111)-4x1-In surface reconstruction investigated by electron transport measurements
We measure the electron conductivity of the surface states and the subsurface
space charge layer originating from the Si(111)-4x1-In reconstruction as a
function of temperature. The conductivity of the surface states drops sharply
around 130 K with decreasing temperature, revealing a metal-insulator phase
transition of the surface reconstruction. In contrast, the influence of the
phase transition on the conductivity of the space charge layer is limited to
temperatures above 60 K. This means that the surface Fermi level remains
strongly pinned despite the phase transition, indicating the presence of free
carriers in the surface states down to rather low temperatures.Comment: 10 pages, 3 figures, submitted to Surface Scienc
Strong Electron Confinement By Stacking-fault Induced Fractional Steps on Ag(111) Surfaces
The electron reflection amplitude at stacking-fault (SF) induced
fractional steps is determined for Ag(111) surface states using a low
temperature scanning tunneling microscope. Unexpectedly, remains as high as
as energy increases from 0 to 0.5 eV, which is in clear contrast
to its rapidly decreasing behavior for monatomic (MA) steps [L. B{\"u}rgi et
al., Phys. Rev. Lett. \textbf{81}, 5370 (1998)]. Tight-binding calculations
based on {\em ab-initio} derived band structures confirm the experimental
finding. Furthermore, the phase shifts at descending SF steps are found to be
systematically larger than counterparts for ascending steps by . These results indicate that the subsurface SF plane significantly
contributes to the reflection of surface states
One-dimensional surface states on a striped Ag thin film with stacking fault arrays
One-dimensional (1D) stripe structures with a periodicity of 1.3 nm are
formed by introduction of stacking fault arrays into a Ag thin film. The
surface states of such striped Ag thin films are studied using a low
temperature scanning tunneling microscope. Standing waves running in the
longitudinal direction and characteristic spectral peaks are observed by
differential conductance (dI/dV) measurements, revealing the presence of 1D
states on the surface stripes. Their formation can be attributed to quantum
confinement of Ag(111) surface states into a stripe by stacking faults. To
quantify the degree of confinement, the effective potential barrier at the
stacking fault for Ag(111) surface states is estimated from independent
measurements. A single quantum well model with the effective potential barrier
can reproduce the main features of dI/dV spectra on stripes, while a
Kronig-Penney model fails to do so. Thus the present system should be viewed as
decoupled 1D states on individual stripes rather than as anisotropic 2D Bloch
states extending over a stripe array.Comment: 10 pages, 6 figure
Molecular Dynamics Simulations of Dynamic Force Microscopy: Applications to the Si(111)-7x7 Surface
Molecular dynamics simulations have been performed to understand true atomic
resolution, which has been observed on the Si(111)-77 surface by
dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale
contrast is reproduced in simulations at constant mean height above a critical
tip-sample separation when monitoring the interaction force between tip and
sample. Missing or additional adatoms can be recognized in such scans, although
they are less well resolved than native adatoms. The resonance frequency shift,
as well as arbitrary scans, e.g. at constant force can be computed from a
series of force-distance characteristics. By means of dynamic simulations we
show how energy losses induced by interaction with an oscillating tip can be
monitored and that they occur even in the non-contact range.Comment: 5 pages, 5 figures, accepted publication in Applied Surface Scienc
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