24 research outputs found
Exploring alternative metals to Cu and W for interconnects : an ab initio Insight
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A tool flow for predicting system level timing failures due to interconnect reliability degradation
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The Analysis of System-Level Timing Failures Due to Interconnect Reliability Degradation
No full textDemonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization
No full textApplication of a Nano-Mechanical Sensor to Monitor Stress in Copper Damascene Interconnects
No full textReliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
No full textIn situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/low-k damascene interconnects using synchrotron radiation
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