Growth kinetics of solid‐state‐reacted Fe‐Zr multilayer films

Multilayers of Fee0.33Zr0.67, prepared by electron beam evaporation, have been characterized by conversion electron Mijssbauer spectroscopy, Rutherford backscattering spectroscopy, and x-ray diffraction. Two phases, one amorphous and another crystalline (FeZr3), occur by solid-state reaction. For temperatures of 350 and 500 °C and annealing times ranging from 10 min to 72 h the growth rates of both phases had been obtained. From these results we suggest a model to describe the phase growth kinetics of the amorphouscrystalline Fe0.33Zr0.67 multilayer thin film