42 research outputs found

    A Novel Micro-Structured Reference Material for Microbeam Analysis.

    No full text
    Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel

    RBS, SY-XRF, INAA and ICP-IDMS of Antimony Implanted in Silicon. A Multi-Method Approach to Characterize and Certify a Reference Material.

    No full text
    Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel

    Certification of Antinomy Implanted in Silicon Wafer with a Silicon Dioxide Diffusion Barrier

    No full text
    Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel
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