42 research outputs found
A Novel Micro-Structured Reference Material for Microbeam Analysis.
Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel
RBS, SY-XRF, INAA and ICP-IDMS of Antimony Implanted in Silicon. A Multi-Method Approach to Characterize and Certify a Reference Material.
Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel
Contribution of ICP-IDMS to the Certification of Antimony Implanted in a Silicon Wafer - Comparison with RBS and INAA Results.
Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel
Certification of Antinomy Implanted in Silicon Wafer with a Silicon Dioxide Diffusion Barrier
Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel