International Consensus Statement on Allergy and Rhinology: Allergic Rhinitis.

BACKGROUND: Critical examination of the quality and validity of available allergic rhinitis (AR) literature is necessary to improve understanding and to appropriately translate this knowledge to clinical care of the AR patient. To evaluate the existing AR literature, international multidisciplinary experts with an interest in AR have produced the International Consensus statement on Allergy and Rhinology: Allergic Rhinitis (ICAR:AR). METHODS: Using previously described methodology, specific topics were developed relating to AR. Each topic was assigned a literature review, evidence-based review (EBR), or evidence-based review with recommendations (EBRR) format as dictated by available evidence and purpose within the ICAR:AR document. Following iterative reviews of each topic, the ICAR:AR document was synthesized and reviewed by all authors for consensus. RESULTS: The ICAR:AR document addresses over 100 individual topics related to AR, including diagnosis, pathophysiology, epidemiology, disease burden, risk factors for the development of AR, allergy testing modalities, treatment, and other conditions/comorbidities associated with AR. CONCLUSION: This critical review of the AR literature has identified several strengths; providers can be confident that treatment decisions are supported by rigorous studies. However, there are also substantial gaps in the AR literature. These knowledge gaps should be viewed as opportunities for improvement, as often the things that we teach and the medicine that we practice are not based on the best quality evidence. This document aims to highlight the strengths and weaknesses of the AR literature to identify areas for future AR research and improved understanding

International Consensus Statement on Allergy and Rhinology: Allergic Rhinitis

Background: Critical examination of the quality and validity of available allergic rhinitis (AR) literature is necessary to improve understanding and to appropriately translate this knowledge to clinical care of the AR patient. To evaluate the existing AR literature, international multidisciplinary experts with an interest in AR have produced the International Consensus statement on Allergy and Rhinology: Allergic Rhinitis (ICAR:AR).Methods: Using previously described methodology, specific topics were developed relating to AR. Each topic was assigned a literature review, evidence-based review (EBR), or evidence-based review with recommendations (EBRR) format as dictated by available evidence and purpose within the ICAR:AR document. Following iterative reviews of each topic, the ICAR:AR document was synthesized and reviewed by all authors for consensus.Results: The ICAR:AR document addresses over 100 individual topics related to AR, including diagnosis, pathophysiology, epidemiology, disease burden, risk factors for the development of AR, allergy testing modalities, treatment, and other conditions/comorbidities associated with AR.Conclusion: This critical review of the AR literature has identified several strengths; providers can be confident that treatment decisions are supported by rigorous studies. However, there are also substantial gaps in the AR literature. These knowledge gaps should be viewed as opportunities for improvement, as often the things that we teach and the medicine that we practice are not based on the best quality evidence. This document aims to highlight the strengths and weaknesses of the AR literature to identify areas for future AR research and improved understanding. </p

Evaluation of thickness and residual stress of shallow surface regions from diffraction profiles

Residual stresses resulting from surface treatment methods like shot peening generally show a more or less steep stress gradient versus depth. X-ray diffraction is the most used method for depth profiling in case of near-surface stress gradients due to the small penetration depth of X-rays resulting in a high depth resolution. When the stress gradient is very steep and the stressed surface layer is in the range of the penetration depth of the X-rays, asymmetric diffraction lines may occur and determination of the diffraction line position has to be done with great care. In case of the stressed surface layer being thinner than the penetration depth of the X-rays a (partial) splitting of the diffraction line may occur which may allow to separately calculate both the mean stresses of the layer and the base material and additionally to determine the thickness of the stressed surface layer. For a shot peened silicon nitride ceramic the evaluation of the mean stress in the thin surface layer, the stress in the underlying base material and the thickness of the stressed surface layer on basis of profile fitting methods is demonstrated with special emphasis on the influence of the method used for determining the diffraction line position

Effiziente Eigenspannungsanalyse reibrührgeschweißter Raumfahrt-Komponenten

Friction stir welding (FSW) is increasingly used joining of high-strength aluminum components. Residual stresses resulting from FSW may reduce performance of components and have to be taken into account in design. In most cases, for the experimental determination of residual stresses parts cut from components are used. The question is, whether the residual stress state of the part and the component is comparable or, at least, allows for a conservative assessment of the influence of residual stresses

Progress on up- and down-converted fluorescence in rare-doped fluorozirconate-based glass ceramics for high efficiency solar cells

Transparent glasses as up- or down-converters are attractive systems to increase the efficiency of solar cells. Er-doped fluorozirconate (FZ) glasses show an intense up-conversion upon excitation at 1540 nm. Transmission spectra show that the absorbance at 1540 nm grows linearly with the Er-doping level. In Eu-doped FZ glasses, which were additionally doped with chlorine ions, the growth of BaCl2 nanocrystals can be observed upon thermal annealing. For high annealing temperatures a phase change from hexagonal to orthorhombic phase BaCl2 can be seen. Upon excitation in the ultraviolet (UV) spectral range these glass ceramics emit an intense blue emission. A combination of a silicon solar cell and an Eu-doped FZ glass ceramic as a down-converting top layer shows an increase in the short circuit current in the UV spectral range compared to a solar cell without a down-converting top layer

Arsaalkenes R-As=C(NMe2)(2) [R = PhC(O), 4-EtC6H4C(O), 2,4,6-Me3C6H2C(O), t-BuC(O), Me3Si]: Versatile reagents in the chemistry of heterocumulenes

Weber L, Bayer P, Braun T, Stammler H-G, Neumann B. Arsaalkenes R-As=C(NMe2)(2) [R = PhC(O), 4-EtC6H4C(O), 2,4,6-Me3C6H2C(O), t-BuC(O), Me3Si]: Versatile reagents in the chemistry of heterocumulenes. Organometallics. 2006;25(7):1786-1794.Reaction of [Cp(CO)(2)M=P=C(SiMe3)(2.)] (where M = Mo (3a), W (3b)] with 2 equiv of the arsaalkene PhC(O)As=C(NMe2)(2) afforded the metalloarsaalkenes Cp(CO)(2)M-As=C(Ph)-O-P-O-C(Ph)=As-C(SiMe3)(2) [where M= Mo (6a), W (6b)]. Small amounts of [{eta(3):eta(3)-(Me3Si)(2)CPAs-AsPC(SiMe3)(2)}- {Mo(CO)(2)Cp}(2)] (7) were formed as a minor product. Similarly, 3b and 2 equiv of 4-EtC6H4C(O)As= C(NMe2)(2) gave rise to the formation of [Cp(CO)(2)W-As=C(4-EtC6H4)-O-P-O-C(4-EtC6H4)=As- C(SiMe3)(2)] (8). However, treatment of 3a and 3b with an excess of tBuC(O)As=C(NMe2)(2) yielded cocrystals of the eta(3)-2-phospha-1,3-diarsaallyl complexes [Cp(CO)(2)M{eta(3)-tBuC(O)AsPAsC(O)tBu}] [where M = Mo (13a), W (13b)] and the eta(3)-1,2,3-triarsaallyl complexes [Cp(CO)(2)M{eta(3-)tBuC(O)AsAsAsC-(O)tBu}] [where M = Mo (14a), W (14b)] in varying ratios. Reaction of 3a with Me3SiAs=C(NMe2)(2) afforded the dinuclear 1,2-diphosphapropene complex [{eta(2):eta(2)-(Me3Si)(2)C=P-P(H)-C(H)(SiMe3)(2)}{Mo-(CO)(2)Cp}(2)] (15). The novel compounds 6a,b, 8, 13a,b, 14a,b, and 15 were characterized by means of spectroscopy (IR and H-1, C-13{H-1}, P-31 NMR). Moreover the molecular structures of 7, 8, 13a, 14a, 13b, 14b, and 15 were determined by X-ray diffraction analyses