19 research outputs found

    Robust estimation of bacterial cell count from optical density

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    Optical density (OD) is widely used to estimate the density of cells in liquid culture, but cannot be compared between instruments without a standardized calibration protocol and is challenging to relate to actual cell count. We address this with an interlaboratory study comparing three simple, low-cost, and highly accessible OD calibration protocols across 244 laboratories, applied to eight strains of constitutive GFP-expressing E. coli. Based on our results, we recommend calibrating OD to estimated cell count using serial dilution of silica microspheres, which produces highly precise calibration (95.5% of residuals <1.2-fold), is easily assessed for quality control, also assesses instrument effective linear range, and can be combined with fluorescence calibration to obtain units of Molecules of Equivalent Fluorescein (MEFL) per cell, allowing direct comparison and data fusion with flow cytometry measurements: in our study, fluorescence per cell measurements showed only a 1.07-fold mean difference between plate reader and flow cytometry data

    Impact of thermal-induced sapphire substrate erosion on material and photodetector characteristics of sputtered Ga2O3 films

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    Monoclinic ÎČ–phase gallium oxide (ÎČ-Ga2O3) films were deposited on c-plane sapphire substrates using a combination of sputtering and post annealing processes. The effect of thermal-induced sapphire substrate erosion on material characteristics of sputtered ÎČ-Ga2O3 film has been investigated. Both the furnace and rapid thermal annealing (RTA) were performed in the air ambient for the post thermal treatments. After the annealing process, all the deposited films transformed from amorphous to monoclinic crystalline structure with excellent transmittance above 80% in the visible region. Meanwhile, a thermal-induced interdiffusion phenomenon has been observed in ÎČ-Ga2O3/sapphire architecture, particularly for furnace-annealed samples. Even though high-temperature post thermal treatments can enhance the crystallinity of the Ga2O3 films continuously, a degraded photodetector performance is observed for the samples annealed above 800 °C due to the thermal-induced aluminum (Al) diffusion issue. The interdiffusion mechanism for the sputtered Ga2O3-on-sapphire films is proposed and its effects on material and photodetector characteristics are elucidated. An optimum metal-semiconductor-metal photodetector performance is achieved for the 800°C-RTA-treated Ga2O3 sample with the photo/dark current ratio of 1.78 × 105 and responsivity of 0.553 A/W (at 5 V bias)

    Rapid assessment of heavy metal pollution using ion-exchange resin sachets and micro-XRF core-scanning

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    Conventional pollution monitoring strategies for heavy metals are often costly and unpractical. Innovative sampling and analytical approaches are therefore needed to efficiently monitor large areas. This study presents a novel, simple, fast, and inexpensive method to monitor heavy metal pollution that uses cation-exchange resin sachets and the micro-XRF core-scanning technique (XRF-CS). The resin passive samplers act as concentrators of cationic species and can be readily deployed spatially and temporally to record pollution signals. The large number of analytical tasks are then overcome by the fast and non-destructive XRF-CS to precisely assess elemental concentrations. Quantifying element loading involves direct comparison with a set of identically prepared and scanned resin reference standards containing Ca, Ti, Cr, Mn, Ni, Cu, Zn, Pb. The results show that within the test range (from 0–1000 s mg kg −1 ), the calibration lines have excellent regressions (R 2 ≄ 0.97), even at the shortest exposure time (1 s). A pilot field survey of a suspected polluted area in central Taiwan, where 30 resin sachets had been deployed, identified a pollution hot spot in a rapid and economical manner. Therefore, this approach has the potential to become a valuable tool in environmental monitoring and forensics. </p

    IoT: Source of Test Challenges

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    © 2016 IEEE. The semiconductor industry has been driving a major part of its growth through first the PC and more recently the mobile market. Unfortunately, the PC market is in decline and also the end of the growth curve for mobile products is in sight now that virtually everyone on the planet has a smartphone and/or tablet. Hence, the semiconductor industry is putting its bets on 'Internet of Things' (IoT) as the next application wave that will allow them to sell a lot of silicon real estate. Although what exactly IoT encompasses is under definition and hence still volatile, the first emerging products depict an image which is quite different from the traditional microprocessors or smartphone SOCs: small but with ubiquitous presence, wirelessly connected, energy harvesting, equipped with smart sensors, secure, and low cost. All these aspects have a profound impact on the challenges, solutions, and associated trade-offs for testing IoT chips and provide rich grounds for research. This paper provides seven views from different angles.status: publishe

    Single-Crystalline Aluminum Nanostructures on a Semiconducting GaAs Substrate for Ultraviolet to Near-Infrared Plasmonics

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    Aluminum, as a metallic material for plasmonics, is of great interest because it extends the applications of surface plasmon resonance into the ultraviolet (UV) region and is superior to noble metals in natural abundance, cost, and compatibility with modern semiconductor fabrication processes. Ultrasmooth single-crystalline metallic films are beneficial for the fabrication of high-definition plasmonic nanostructures, especially complex integrated nanocircuits. The absence of surface corrugation and crystal boundaries also guarantees superior optical properties and applications in nanolasers. Here, we present UV to near-infrared plasmonic resonance of single-crystalline aluminum nanoslits and nanoholes. The high-definition nanostructures are fabricated with focused ion-beam milling into an ultrasmooth single-crystalline aluminum film grown on a semiconducting GaAs substrate with a molecular beam epitaxy method. The single-crystalline aluminum film shows improved reflectivity and reduced two-photon photoluminescence (TPPL) due to the ultrasmooth surface. Both linear scattering and nonlinear TPPL are studied in detail. The nanoslit arrays show clear Fano-like resonance, and the nanoholes are found to support both photonic modes and localized surface plasmon resonance. We also found that TPPL generation is more efficient when the excitation polarization is parallel rather than perpendicular to the edge of the aluminum film. Such a counterintuitive phenomenon is attributed to the high refractive index of the GaAs substrate. We show that the polarization of TPPL from aluminum preserves the excitation polarization and is independent of the crystal orientation of the film or substrate. Our study gains insight into the optical property of aluminum nanostructures on a high-index semiconducting GaAs substrate and illustrates a practical route to implement plasmonic devices onto semiconductors for future hybrid nanodevices
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