The simultaneous measurement of energy and linear polarization of the scattered radiation in resonant inelastic soft x-ray scattering

Resonant Inelastic X-ray Scattering (RIXS) in the soft x-ray range is an element-specific energy-loss spectroscopy used to probe the electronic and magnetic excitations in strongly correlated solids. In the recent years, RIXS has been progressing very quickly in terms of energy resolution and understanding of the experimental results, but the interpretation of spectra could further improve, sometimes decisively, from a full knowledge of the polarization of incident and scattered photons. Here we present the first implementation, in a high resolution RIXS spectrometer used to analyze the scattered radiation, of a device allowing the measurement of the degree of linear polarization. The system, based on a graded W/B4C multilayer mirror installed in proximity of the CCD detector, has been installed on the AXES spectrometer at the ESRF; it has been fully characterized and it has been used for a demonstration experiment at the Cu L3 edge on a high-Tc superconducting cuprate. The loss in efficiency suffered by the spectrometer equipped with this test facility was a factor 17.5. We propose also a more advanced version, suitable for a routine use on the next generation of RIXS spectrometers and with an overall efficiency up to 10%.Comment: 26 pages, 8 figure

Graded multilayers for fully polarization resolved Resonant Inelastic X-ray Scattering in the soft x-ray range

On the upgraded ESRF soft x-ray beamline ID32 a new spectrometer for Resonant X-ray Inelastic Scattering (RIXS) will be installed. To operate in fully polarized mode, a polarimeter will be inserted in the instrument to measure simultaneously the energy spectra and the linear polarization. The new spectrometer works between 500 eV and 1000 eV and requires graded multilayers to optimize the energy tunability and the polarization sensitivity. The present work covers the design, the fabrication, and the characterization of the multilayers. Performance evaluations during test and commissioning experiments with soft x-rays complement the paper

Electrical fatigue behavior of Ba0.85Ca0.15Zr0.1Ti0.9O3 ceramics under different oxygen concentrations

Fatigue degradation is a significant problem in piezo/ferroelectric materials and their commercial applications. The major causes of electrical fatigue degradation are a domain pinning effect and physical damage such as microcracking. This work reports the fatigue behavior of barium calcium zirconate titanate (Ba0.85Ca0.15Zr0.1Ti0.9O3) under regular and low oxygen concentration silicone oil. Impedence analyzer and LCR meter are employed to analyzer the dielectric properties and it also revealed the relationship between activation energy and oxygen vacancy. X-ray diffraction, synchrotron X-ray absorption spectroscopy, and scanning electron microscope techniques were employed to study the local structural changes, defect development, physical damage and microcracking in the ceramics. FEFF-8.4 simulations were used to determine the oxygen vacancy creation. The study reveals the relationship of oxygen vacancy creation, domain wall pinning, microcracking and the fatigue behavior of the ferroelectric ceramic. The work investigated the dielectric and ferroelectric properties of BCZT ceramics intermes of applied electric field

Interplay of negative electronic compressibility and capacitance enhancement in lightly-doped metal oxide Bi0.95La0.05FeO3 by quantum capacitance model.

Light-sensitive capacitance variation of Bi0.95La0.05FeO3 (BLFO) ceramics has been studied under violet to UV irradiation. The reversible capacitance enhancement up to 21% under 405 nm violet laser irradiation has been observed, suggesting a possible degree of freedom to dynamically control this in high dielectric materials for light-sensitive capacitance applications. By using ultraviolet photoemission spectroscopy (UPS), we show here that exposure of BLFO surfaces to UV light induces a counterintuitive shift of the O2p valence state to lower binding energy of up to 243 meV which is a direct signature of negative electronic compressibility (NEC). A decrease of BLFO electrical resistance agrees strongly with the UPS data suggesting the creation of a thin conductive layer on its insulating bulk under light irradiation. By exploiting the quantum capacitance model, we find that the negative quantum capacitance due to this NEC effect plays an important role in this capacitance enhancement