Precise Measurement of Gravity Variations During a Total Solar Eclipse

The variations of gravity were measured with a high precision LaCoste-Romberg D gravimeter during a total solar eclipse to investigate the effect of solar eclipse on the gravitational field. The observed anomaly $(7.0 \pm 2.7) \times 10^{-8}$ m/s$^2$ during the eclipse implies that there may be a shielding property of gravitation

A Census Of Highly Symmetric Combinatorial Designs

As a consequence of the classification of the finite simple groups, it has been possible in recent years to characterize Steiner t-designs, that is t-(v,k,1) designs, mainly for t = 2, admitting groups of automorphisms with sufficiently strong symmetry properties. However, despite the finite simple group classification, for Steiner t-designs with t > 2 most of these characterizations have remained longstanding challenging problems. Especially, the determination of all flag-transitive Steiner t-designs with 2 < t < 7 is of particular interest and has been open for about 40 years (cf. [11, p. 147] and [12, p. 273], but presumably dating back to 1965). The present paper continues the author's work [20, 21, 22] of classifying all flag-transitive Steiner 3-designs and 4-designs. We give a complete classification of all flag-transitive Steiner 5-designs and prove furthermore that there are no non-trivial flag-transitive Steiner 6-designs. Both results rely on the classification of the finite 3-homogeneous permutation groups. Moreover, we survey some of the most general results on highly symmetric Steiner t-designs.Comment: 26 pages; to appear in: "Journal of Algebraic Combinatorics

Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives

This paper discusses the fundamentals, applications, potential, limitations, and future perspectives of polarized light reflection techniques for the characterization of materials and related systems and devices at the nanoscale. These techniques include spectroscopic ellipsometry, polarimetry, and reflectance anisotropy. We give an overview of the various ellipsometry strategies for the measurement and analysis of nanometric films, metal nanoparticles and nanowires, semiconductor nanocrystals, and submicron periodic structures. We show that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about process control, geometry factors, anisotropy, defects, and quantum confinement effects of nanostructures

Minimal generating sets of maximal size in finite monolithic groups

Denote by m(G) the largest size of a minimal generating set of a finite group G. We want to estimate the difference m(G) - m(G/N) in the case when N is the unique minimal normal subgroup of G