17 research outputs found
One-dimensional Modelling and Optimisation of an Industrial Steam Methane Reformer
Steam methane reforming is one of the most promising processes to convert natural gas into valuable products such as hydrogen. In this study, a one-dimensional model was used to model and optimise an industrial steam methane reformer, using mass and thermal balances coupled with pressure drop in the reformer tube. The proposed model was validated by the experimental data. Furthermore, the effects of flowrate and temperature of the feed, tube wall temperature, and tube dimension on the reformer performance were studied. Finally, a multiobjective optimisation was done for methane slip minimisation and hydrogen production maximisation using genetic algorithm. The results illustrated the optimum feed flowrate of 2761.9 kmol h–1 (minimum 32 mol.% produced hydrogen and maximum 0.15 mol.% unreacted methane). This is one of the few studies on investigation of steam methane reformer using a simple and effective model, and genetic algorithm.
This work is licensed under a Creative Commons Attribution 4.0 International License
Robust algorithm for isotropic reconstruction of magic-angle spinning solid-state NMR spectra
The study on the tourism industry attitude of the visit Korea of Tourism experts in Iran
Atomic Layer Deposition of Al<sub>2</sub>O<sub>3</sub> on WSe<sub>2</sub> Functionalized by Titanyl Phthalocyanine
To
deposit an ultrathin dielectric onto WSe<sub>2</sub>, monolayer
titanyl phthalocyanine (TiOPc) is deposited by molecular beam epitaxy
as a seed layer for atomic layer deposition (ALD) of Al<sub>2</sub>O<sub>3</sub> on WSe<sub>2</sub>. TiOPc molecules are arranged in
a flat monolayer with 4-fold symmetry as measured by scanning tunneling
microscopy. ALD pulses of trimethyl aluminum and H<sub>2</sub>O nucleate
on the TiOPc, resulting in a uniform deposition of Al<sub>2</sub>O<sub>3</sub>, as confirmed by atomic force microscopy and cross-sectional
transmission electron microscopy. The field-effect transistors (FETs)
formed using this process have a leakage current of 0.046 pA/μm<sup>2</sup> at 1 V gate bias with 3.0 nm equivalent oxide thickness,
which is a lower leakage current than prior reports. The n-branch
of the FET yielded a subthreshold swing of 80 mV/decade