A simplified algorithm for leaky network analyzer calibration

A new algorithm for network analyzer calibration is presented. The error model includes leakage effects and can be applied to a general n-port NWA. The 2-port 16-term model becomes a special case of this new technique which is also hopefully suitable for the calibration problems of multiport on-wafer probing systems. Experimental results testify the effectiveness of the new approach

Comparison between a vector multiport network analyzer and the national S-parameter measurement system

A multiport vector network analyzer based on a new calibration concept, has been compared with the P-port S-parameter National measurement system at IENGF. The measurements were performed on precision 7 mm standard components and exhibited an optimum agreement. These results open the possibility to use the new multiport network analyzer for certification measurements of multiport device

Accuracy of a multiport network analyzer

The accuracy of a multiport vector network analyzer, which uses a new calibration concept, has been compared with a 2-port network analyzer that implements the classical TRL procedure. The accuracy assessment is based on the analysis of the error propagation due to the connectors repeatability, both of the used standards and the measurands. The comparison, performed in the 2-18 GHz band on devices fitted with APC-7 mm connectors, proved the high accuracy reached by a multiport system which can qualify for metrological applications

Accurate coaxial standard verification by multiport vector network analyzer

We propose a new general formulation for calibrating a multiport network analyzer (NWA), which requires at least only one fully known two port standard and one partially known load (i.e. a sliding load). In principle, since only one fully known two port component is required, the multiport NWA should reach an accuracy higher than an ordinary two-port NWA whose calibration relies on more than one standard. Experimental results confirm the high accuracy of the multiport (n>=3) NWA, through the verification of commercially available two port standards

Small and large signal device characterization made easier and faster with an integrated test system

The authors describe a microwave test set that can be automatically reconfigured to perform linear and nonlinear characterization. Particular attention was devoted to speeding up the load pull contour tracking process. The test set measures S-parameters, power levels, gains, and harmonics up to 26 GHz. The software can set different loads randomly or by a special algorithm which automatically tracks power, gain, or efficiency contours. The test set was used to fully characterize several MESFETs up to 20 GHz. The system can be computer or manually driven and is particularly oriented to production tests