20 research outputs found

    In Situ Spectroscopic Investigation of Molecular Structures of Highly Dispersed Vanadium Oxide on Silica under Various Conditions

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    The molecularly dispersed V2O5/SiO2 supported oxides were prepared by the incipient wetness impregnation of 2-propanol solutions of V-isopropoxide. The experimental maximum dispersion of surface vanadium oxide species on SiO2 was achieved at ~12 wt % V2O5 ( ~2.6 V atoms/nm^2 ). The surface structures of the molecularly dispersed V2O5/SiO2 samples under various conditions were extensively investigated by in situ Raman, UV- vis-NIR DRS and XANES spectroscopies. The combined characterization techniques revealed that in the dehydrated state only isolated VO4 species are present on the silica surface up to monolayer coverage. Interestingly, the three-member siloxane rings on the silica surface appear to be the most favorable sites for anchoring the isolated, three-legged (SiO)3 V=O species. Hydration dramatically changes the molecular structure of the surface vanadium oxide species. The specific structure of the hydrated surface vanadium oxide species is dependent on the degree of hydration. The molecular structure of the fully hydrated vanadium oxide species closely resembles V2O5路nH2O gels, rather than V2O5 crystallites. The fully hydrated surface vanadium oxide species are proposed to be chain and/or two-dimensional polymers with highly distorted square-pyramidal VO5 connected by V-OH-V bridges, which are stabilized on the silica surface by the sixth neighbor of Si-OH hydroxyls via Si-OH路路路V hydrogen bonds. In analogy to the hydration process, alcoholysis occurs during methanol chemisorption, and similar molecular structures are proposed to interpret the interaction between methanol molecules and the surface vanadium oxide species on silica

    Surface analysis of zeolites An XPS, variable kinetic energy XPS, and low energy ion scattering study

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    The surface Si/Al ratio in a series of zeolite Y samples has been obtained using laboratory XPS, synchrotron (variable kinetic energy) XPS, and low energy ion scattering (LEIS) spectroscopy. The non-destructive depth profile obtained using variable kinetic energy XPS is compared to that from the destructive argon ion bombardment depth profile from the lab XPS instrument. All of the data indicate that the near surface region of both the ammonium form and steamed Y zeolites is strongly enriched in aluminum. It is shown that when the inelastic mean free path of the photoelectrons is taken into account the laboratory XPS of aluminosilicates zeolites does not provide a true measurement of the surface stoichiometry, while variable kinetic energy XPS results in a more surface sensitive measurement. A comprehensive Si/Al concentration profile as a function of depth is developed by combining the data from the three surface characterization techniques. The LEIS spectroscopy reveals that the topmost atomic layer is further enriched in Al compared to subsequent layers

    Comparison of EXAFS foil spectra from around the world

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    The EXAFS spectra of Cu and Pd foil from many different beamlines and synchrotrons are compared to address the dependence of the amplitude reduction factor (S{sub 0}{sup 2}) on beamline specific parameters. Even though S{sub 0}{sup 2} is the same parameter as the EXAFS coordination number, the value for S{sub 0}{sup 2} is given little attention, and is often unreported. The S{sub 0}{sup 2} often differs for the same material due to beamline and sample attributes, such that no importance is given to S{sub 0}{sup 2}-values within a general range of 0.7 to 1.1. EXAFS beamlines have evolved such that it should now be feasible to use standard S{sub 0}{sup 2} values for all EXAFS measurements of a specific elemental environment. This would allow for the determination of the imaginary energy (Ei) to account for broadening of the EXAFS signal rather than folding these errors into an effective S{sub 0}{sup 2}-value. To test this concept, we model 11 Cu-foil and 6 Pd-foil EXAFS spectra from around the world to compare the difference in S{sub 0}{sup 2}- and Ei-values
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