Influence of Growth Conditions on the Structural and Opto-electronic Quality of GaAsBi

A systematic series of GaAsBi pin diodes was grown by MBE using different growth temperatures and Bi fluxes, to study the effect on the structural and opto-electronic properties of GaAsBi. The Bi contents of the diodes show both growth temperature and Bi flux dependences. The diodes grown at higher temperatures show evidence of long range inhomogeneity from X-ray diffraction (XRD) measurements, whereas samples of comparable Bi content grown at lower temperatures appear to have well defined, uniform GaAsBi regions. However, the high temperature grown diodes exhibit more intense photoluminescence (PL) and lower dark currents. The results suggest that growth temperature related defects have a greater influence on the dark current than bismuth related defects, and therefore GaAsBi devices should be grown at the highest temperature possible for the desired Bi content

Analysis of Bi Distribution in Epitaxial GaAsBi by aberration-corrected HAADF-STEM

The Bi content in GaAs/GaAs1 − xBix/GaAs heterostructures grown by molecular beam epitaxy at a substrate temperature close to 340 °C is investigated by aberration-corrected high-angle annular dark-field techniques. The analysis at low magnification of high-angle annular dark-field scanning transmission electron microscopy images, corroborated by EDX analysis, revealed planar defect-free layers and a non-homogeneous Bi distribution at the interfaces and within the GaAsBi layer. At high magnification, the qHAADF analysis confirmed the inhomogeneous distribution and Bi segregation at the GaAsBi/GaAs interface at low Bi flux and distorted dumbbell shape in areas with higher Bi content. At higher Bi flux, the size of the Bi gathering increases leading to roughly equiaxial Bi-rich particles faceted along zinc blende {111} and uniformly dispersed around the matrix and interfaces. FFT analysis checks the coexistence of two phases in some clusters: a rhombohedral pure Bi (rh-Bi) one surrounded by a zinc blende GaAs1 − xBix matrix. Clusters may be affecting to the local lattice relaxation and leading to a partially relaxed GaAsBi/GaAs system, in good agreement with XRD analysis

Growth of InAs(Bi)/GaAs quantum dots under a bismuth surfactant at high and low temperature

Indium arsenide quantum dots are of great interest for next-generation telecom optoelectronics if their emission wavelength can be red shifted into the correct range. One method to achieve this is the deposition of a surfactant, such as bismuth, during quantum dot growth. Here, we present a series of indium arsenide quantum dot layers grown using several bismuth fluxes and two different growth temperatures. The effects of bismuth flux on quantum dot morphology and optical properties are studied by atomic force microscopy and photoluminescence measurements. Bimodal distributions of quantum dots are seen at low growth temperature, while at high temperature, a single dominant distribution is seen in most of the layers. A medium bismuth flux was seen to produce the highest integrated photoluminescence intensity at high growth temperature, whereas intensity saturates between medium and high fluxes at low growth temperatures. A significant increase in uncorrected aspect ratio seen for the layer grown with a low bismuth flux at high growth temperature presents a new opportunity for control of quantum dot morphology using bismuth

Thermal imaging metrology using high dynamic range near-infrared photovoltaic-mode camera

The measurement of a wide temperature range in a scene requires hardware capable of high dynamic range imaging. We describe a novel near-infrared thermal imaging system operating at a wavelength of 940 nm based on a commercial photovoltaic mode high dynamic range camera and analyse its measurement uncertainty. The system is capable of measuring over an unprecedently wide temperature range; however, this comes at the cost of a reduced temperature resolution and increased uncertainty compared to a conventional CMOS camera operating in photodetective mode. Despite this, the photovoltaic mode thermal camera has an acceptable level of uncertainty for most thermal imaging applications with an NETD of 4–12 °C and a combined measurement uncertainty of approximately 1% K if a low pixel clock is used. We discuss the various sources of uncertainty and how they might be minimised to further improve the performance of the thermal camera. The thermal camera is a good choice for imaging low frame rate applications that have a wide inter-scene temperature range

Modelling of bismuth segregation in InAsBi/InAs superlattices: Determination of the exchange energies

InAsBi dilute alloys are potential new candidates for the improvement of infrared optoelectronic devices such as photodetectors or lasers. In this work, InAsBi/InAs superlattices (SLs)with Bi contents ranging between 1 and 3% were grown by molecular beam epitaxy with different Bi fluxes and growth temperatures to analyze Bi segregation by cross sectional transmission electron microscopy techniques. Bi segregation profiles have been described layer-by-layer using a three-layer fluid exchange mechanism, extracting the values of the As/Bi exchange energies (E 1 , 1.26 ± 0.01 eV and E 2 , 1.36 ± 0.02 eV). A relationship to calculate the activation energies for exchange from the binding energies in III–V alloys is proposed, which would allow predicting them for other hitherto unknown compounds

Photovoltaic characterisation of GaAsBi/GaAs multiple quantum well devices

A series of strained GaAsBi/GaAs multiple quantum well diodes are characterised to assess the potential of GaAsBi for photovoltaic applications. The devices are compared with strained and strain-balanced InGaAs based devices. The dark currents of the GaAsBi based devices are around 20 times higher than those of the InGaAs based devices. The GaAsBi devices that have undergone significant strain relaxation have dark currents that are a further 10–20 times higher. Quantum efficiency measurements show the GaAsBi devices have a lower energy absorption edge and stronger absorption than the strained InGaAs devices. These measurements also indicate incomplete carrier extraction from the GaAsBi based devices at short circuit, despite the devices having a relatively low background doping. This is attributed to hole trapping within the quantum wells, due to the large valence band offset of GaAsBi

Growth of GaAsBi/GaAs multiple quantum wells with up to 120 periods

In this work, we demonstrate the MBE growth of a systematic series of GaAsBi/GaAs multiple quantum well devices with up to 120 periods and report on their structural and optical characterisation. TEM images confirm the incorporation of a record number of wells for this material, while showing reasonable thickness uniformity. Fitting of the XRD data becomes worse as the number of quantum wells increases due to strain relaxation and out-of-plane growth inhomogeneity. The devices are compared to a previous series of devices grown in our group using PL and are found to have less severe strain relaxation due to the thicker barriers and lower average strain in the MQW stack, despite containing a greater number of wells

Effect of MBE growth conditions on GaAsBi photoluminescence lineshape and localised state filling.

A series of gallium arsenide bismide device layers covering a range of growth conditions are thoroughly probed by low-temperature, power-dependent photoluminescence measurements. The photoluminescence data is modelled using a localised state profile consisting of two Gaussians. Good agreement with the raw data is achieved for all layers whilst fixing the standard deviation values of the two Gaussians and constraining the band gap using X-ray diffraction data. The effects of growth temperature and bismuth beam equivalent pressure on the localised state distributions, and other model variables, are both shown to be linked to emission linewidth and device properties. It is concluded that bismuth rich surface conditions are preferable during growth in order to produce the narrowest emission linewidths with this material. These results also show how the growth mode of a gallium arsenide bismide layer can be inferred ex-situ from low-temperature photoluminescence measurements

Temperature and band gap dependence of GaAsBi p-i-n diode current–voltage behaviour

The dark current characteristics of two series of bulk GaAsBi p-i-n diodes are analysed as functions of temperature and band gap. Each temperature dependent measurement indicates that recombination current dominates in these devices. The band gap dependence of the dark currents is also consistent with recombination dominated current for the devices grown at a common growth temperature, indicating that the presence of Bi does not directly adversely affect the dark currents. However, the devices grown at different growth temperatures exhibit a faster increase in dark current with decreasing device band gap, suggesting that a reduced growth temperature causes a reduction in minority carrier lifetime

Spin-3/2 Nucleon and Delta Baryons in Lattice QCD

We present first results for masses of spin-3/2 N and Delta baryons in lattice QCD using Fat-Link Irrelevant Clover (FLIC) fermions. Spin-3/2 interpolating fields providing overlap with both spin-3/2 and spin-1/2 states are considered. In the isospin-1/2 sector, we observe, after appropriate spin and parity projection, a strong signal for the J^P=3/2^- state together with a weak but discernible signal for the 3/2^+ state with a mass splitting near that observed experimentally. We also find good agreement between the 1/2^+/- masses and earlier nucleon mass simulations with the standard spin-1/2 interpolating field. For the isospin-3/2 Delta states, clear mass splittings are observed between the various 1/2^+/- and 3/2^+/- channels, with the calculated level orderings in good agreement with those observed empirically.Comment: 17 pages, 8 figures, 2 table