The Radiation Environment for the LISA/Laser Interferometry Space Antenna

The purpose of this document is to define the radiation environment for the evaluation of degradation due to total ionizing and non-ionizing dose and of single event effects (SEES) for the Laser Interferometry Space Antenna (LISA) instruments and spacecraft. The analysis took into account the radiation exposure for the nominal five-year mission at 20 degrees behind Earth's orbit of the sun, at 1 AU (astronomical unit) and assumes a launch date in 2014. The transfer trajectory out to final orbit has not yet been defined, therefore, this evaluation does not include the impact of passing through the Van Allen belts. Generally, transfer trajectories do not contribute significantly to degradation effects; however, single event effects and deep dielectric charging effects must be taken into consideration especially if critical maneuvers are planned during the van Allen belt passes

Compendium of Current Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA

Sensitivity of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices

Single Event Transients in Voltage Regulators for FPGA Power Supply Applications

As with other bipolar analog devices, voltage regulators are known to be sensitive to single event transients (SET). In typical applications, large output capacitors are used to provide noise immunity. Therefore, since SET amplitude and duration are generally small, they are often of secondary importance due to this capacitance filtering. In low voltage applications, however, even small SET are a concern. Over-voltages may cause destructive conditions. Under-voltages may cause functional interrupts and may also trigger electrical latchup conditions. In addition, internal protection circuits which are affected by load as well as internal thermal effects can also be triggered from heavy ions, causing dropouts or shutdown ranging from milliseconds to seconds. In the case of FPGA power supplies applications, SETS are critical. For example, in the case of Actel FPGA RTAX family, core power supply voltage is 1.5V. Manufacturer specifies an absolute maximum rating of 1.6V and recommended operating conditions between 1.425V and 1.575V. Therefore, according to the manufacturer, any transient of amplitude greater than 75 mV can disrupt normal circuit functions, and overvoltages greater than 100 mV may damage the FPGA. We tested five low dropout voltage regulators for SET sensitivity under a large range of circuit application conditions

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital, linear, and hybrid devices

Radiation Characteristics of a 0.11 Micrometer Modified Commercial CMOS Process

We present radiation data, Total Ionizing Dose and Single Event Effects, on the LSI Logic 0.11 micron commercial process and two modified versions of this process. Modified versions include a buried layer to guarantee Single Event Latchup immunity

Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices

RADECS Short Course Section 4 Radiation Hardness Assurance (RHA) for Space Systems

Contents include the following: Introduction. Programmatic aspects of RHA. RHA componens: requirements and specifications; mission radiation environment; and parts selection and radiation tolerance. Analysis at the function/subsystem/system level: TID/DD; SEE. Conclusion