Enhanced simulations on the Athena/Wide Field Imager instrumental background

The Wide Field Imager (WFI) is one of two focal plane instruments of the Advanced Telescope for High-Energy Astrophysics (Athena), ESA’s next large x-ray observatory, planned for launch in the early 2030s. The current baseline halo orbit is around L2, and the second Lagrangian point of the Sun-Earth system L1 is under consideration. For both potential halo orbits, the radiation environment, solar and cosmic protons, electrons, and He-ions will affect the performance of the instruments. A further critical contribution to the instrument background arises from the unfocused cosmic hard x-ray background. It is important to understand and estimate the expected instrumental background and to investigate measures, such as design modifications or analysis methods, which could improve the expected background level to achieve the challenging scientific requirement (−3 counts  /  cm2  /  keV  /  s at 2 to 7 keV). Previous WFI background simulations done in Geant4 have been improved by taking into account new information about the proton flux at L2. In addition, the simulation model of the WFI instrument and its surroundings employed in Geant4 simulations has been refined to follow the technological development of the WFI camera

Enhanced simulations on the ATHENA/WFI instrumental background

The Wide Field Imager (WFI) is one of two focal plane instruments of the Advanced Telescope for High-Energy Astrophysics (Athena), ESA’s next large X-ray observatory, planned for launch in the early 2030’s. The current baseline halo orbit is around L2, the first Lagrangian point of the Sun-Earth system, L1 is under consideration. For both potential halo orbits the radiation environment, solar and cosmic protons, electrons and He-ions will affect the performance of the instruments. A further critical contribution to the instrument background arises from the unfocused cosmic hard X-ray background. It is important to understand and estimate the expected instrumental background and to investigate measures, like design modifications or analysis methods, which could improve the expected background level in order to achieve the challenging scientific requirement (< 5 × 10−3 cts/cm2/keV/s at 2 - 7 keV). Previous WFI background simulations1 done in Geant4 have been improved by taking into account new information about the proton flux at L2. In addition, the simulation model of the WFI instrument and its surroundings employed in GEANT4 simulations has been refined to follow the technological development of the WFI camera

Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources

Fourth generation accelerator-based light sources, such as VUV and X-ray Free Electron Lasers (FEL), deliver ultra-brilliant (similar to 10(12)-10(13) photons per bunch) coherent radiation in femtosecond ( 10100 fs) pulses and, thus, require novel focal plane instrumentation in order to fully exploit their unique capabilities. As an additional challenge for detection devices, existing (FLASH. Hamburg) and future FELs (LCLS, Menlo Park; SCSS, Hyogo and the European XFEL, Hamburg) cover a broad range of photon energies from the EUV to the X-ray regime with significantly different bandwidths and pulse structures reaching up to MHz micro-bunch repetition rates. Moreover, hundreds up to trillions of fragment particles, ions, electrons or scattered photons can emerge when a single light flash impinges on matter with intensities up to 10(22) W/cm(2). In order to meet these challenges, the Max Planck Advanced Study Group (ASG) within the Center for Free Electron Laser Science (CFEL) has designed the CFEL-ASG MultiPurpose (CAMP) chamber. It is equipped with specially developed photon and charged particle detection devices dedicated to cover large solid-angles. A variety of different targets are supported, such as atomic, (aligned) molecular and cluster jets, particle injectors for bio-samples or fixed target arrangements. CAMP houses 4 pi solid-angle ion and electron momentum imaging spectrometers ("reaction microscope", REMI, or "velocity map imaging", VMI) in a unique combination with novel, large-area, broadband (50 eV-25 keV), high-dynamic-range, single-photon-counting and imaging X-ray detectors based on the pnCCDs. This instrumentation allows a new class of coherent diffraction experiments in which both electron and ion emission from the target may be simultaneously monitored. This permits the investigation of dynamic processes in this new regime of ultra-intense, high-energy radiation matter interaction. After an introduction into the salient features of the CAMP chamber and the properties of the redesigned REMI/VMI spectrometers, the new 1024 x 1024 pixel format pnCCD imaging detector system will be described in detail. Results of tests of four smaller format (256 x 512) devices of identical performance, conducted at FLASH and BESSY, will be presented and the concept as well as the anticipated properties of the full, large-scale system will be elucidated. The data obtained at both radiation sources illustrate the unprecedented performance of the X-ray detectors, which have a voxel size of 75 x 75 x 4501 mu m(3) and a typical read-out noise of 2.5 electrons (rms) at an operating temperature of -50 degrees C. (C) 2010 Elsevier B.V. All rights reserved

Ultra-efficient ionization of heavy atoms by intense X-ray free-electron laser pulses

X-ray free-electron lasers provide unique opportunities for exploring ultrafast dynamics and for imaging the structures of complex systems. Understanding the response of individual atoms to intense X-rays is essential for most free-electron laser applications. First experiments have shown that, for light atoms, the dominant interaction mechanism is ionization by sequential electron ejection, where the highest charge state produced is defined by the last ionic state that can be ionized with one photon. Here, we report an unprecedentedly high degree of ionization of xenon atoms by 1.5 keV free-electron laser pulses to charge states with ionization energies far exceeding the photon energy. Comparing ion charge-state distributions and fluorescence spectra with state-of-the-art calculations, we find that these surprisingly high charge states are created via excitation of transient resonances in highly charged ions, and predict resonance enhanced absorption to be a general phenomenon in the interaction of intense X-rays with systems containing high-Z constituents

Femtosecond X-ray protein nanocrystallography

X-ray crystallography provides the vast majority of macromolecular structures, but the success of the method relies on growing crystals of sufficient size. In conventional measurements, the necessary increase in X-ray dose to record data from crystals that are too small leads to extensive damage before a diffraction signal can be recorded1, 2, 3. It is particularly challenging to obtain large, well-diffracting crystals of membrane proteins, for which fewer than 300 unique structures have been determined despite their importance in all living cells. Here we present a method for structure determination where single-crystal X-ray diffraction ‘snapshots’ are collected from a fully hydrated stream of nanocrystals using femtosecond pulses from a hard-X-ray free-electron laser, the Linac Coherent Light Source4. We prove this concept with nanocrystals of photosystem I, one of the largest membrane protein complexes5. More than 3,000,000 diffraction patterns were collected in this study, and a three-dimensional data set was assembled from individual photosystem I nanocrystals (~200 nm to 2 μm in size). We mitigate the problem of radiation damage in crystallography by using pulses briefer than the timescale of most damage processes6. This offers a new approach to structure determination of macromolecules that do not yield crystals of sufficient size for studies using conventional radiation sources or are particularly sensitive to radiation damage