Atomic force microscopy as a tool for testing biomedical samples and elimination probe artifacts

Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala jeste mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd., i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a samo su aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena zasniva se na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za "slepu rekonstrukciju" vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde izračunava se iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman. Prikazani rezultati očigledan su dokaz upotrebne vrednosti mikroskopije atomskim silama kao tehnike za snimanja bioloških materijala u nanodimenzionalnom svetu, a primenjeni algoritmi povećavaju upotrebnu vrednost snimaka u smislu boljeg zaključivanja na osnovu preciznijih numeričkih podataka uzetih sa procesuiranih snimaka.One of the most perspective available techniques for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip. The presented results are clear proof of the usability of atomic force microscopy as a technique for imaging of biological materials on nano-level, and the applied algorithms increase the usability of the images in terms of a better conclusion based on precise numerical data taken from the processed images

Atomic force microscopy as a tool for testing biomedical samples and elimination probe artifacts

Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala jeste mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd., i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a samo su aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena zasniva se na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za "slepu rekonstrukciju" vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde izračunava se iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman. Prikazani rezultati očigledan su dokaz upotrebne vrednosti mikroskopije atomskim silama kao tehnike za snimanja bioloških materijala u nanodimenzionalnom svetu, a primenjeni algoritmi povećavaju upotrebnu vrednost snimaka u smislu boljeg zaključivanja na osnovu preciznijih numeričkih podataka uzetih sa procesuiranih snimaka.One of the most perspective available techniques for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip. The presented results are clear proof of the usability of atomic force microscopy as a technique for imaging of biological materials on nano-level, and the applied algorithms increase the usability of the images in terms of a better conclusion based on precise numerical data taken from the processed images

SPM characterization of materals and its improvements by probe defects analysis

Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala je mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd, i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a su samo aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena se zasniva na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za “slepu rekonstrukciju” vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde se izračunava iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman.One of the most perspective available technique for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The advantage of the method is that they have no restrictions related to origin and composition of the material, and its possibilities to investigate vide variety of materials. This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. However, images obtained by AFM represent only approximation of the sample surfaces. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip

General ergonomic considerations of design of a telerobotic system

Designing the man - telerobot system requires a multidisciplinary approach. Ergonomics has an important role in almost all stages of the designing of this complex system. One of its main role consists in optimization of sensory, mental and physical workload of operators.One of the first steps in designing of a system that contains a teleoperator consists in determining the optimal distribution of functions between operator and telerobot. This distribution of functions is dependent on the types of interactions between mentioned entities, which are considered in this paper. Interface components also need to be designed in accordance with the ergonomic principles. Conclusion of the paper is that depending on the specific task that needs to be done depends the design solution of the telerobotic system

Occupational hazards in dentistry - applications of the near infrared spectroscopy in diagnostics of fatigue and musculoskeletal disorders

Practice in dentistry requires high degree of attention and precision during work related tasks. Awkward standing postures and sitting positions, repetitious hand and wrist movements, as well as mechanical vibrations originating from high-speed instruments can lead to development of musculoskeletal disorders. The objective of this paper is to assess suitability of application of near infrared spectroscopy as a method for evaluation of musculoskeletal disorders in dentists

Towards sustainable solutions for fly ash reapplication through mechanical activation

The aim of investigation was to find sustainable solution for coal fly ash reapplication by increasing its reactivity through mechano-activation. For obtaining complete insight into activation process an understanding of theoretical principles of activator operation is necessary. The vibratory mill was used in experiments. The characteristics of activated ash and possibility of grain inertia measurement by automatic grain counter were analyzed. Following proposed AGC operating hypothesis, energy and properties of ash grains induced by mechanical force were expressed as grain inertia change. The ash used in experiment was thoroughly analyzed by XRD and SEM methods. The final result was establishing of the upper limit of activation period

SPM characterization of materals and its improvements by probe defects analysis

Jedna od najperspektivnijih tehnika za ispitivanje sastava, strukture i svojstava materijala je mikroskopija sondama za skeniranje (SPM), odnosno njene komponente mikroskopija tunelovanjem elektrona (STM) i mikroskopija atomskim silama (AFM). Ovim metodama se rutinski postiže nanometarska i atomska rezolucija. Posebno istaknuta prednost metode je da ne postoje ograničenja u smislu porekla i sastava uzoraka, te je moguće ispitivanje organskih i neorganskih materijala. Ova tehnika se primenjuje u savremenim multidisciplinarnim istraživanjima u oblasti medicine, farmacije, stomatologije, nauke o materijalima, itd, i to za ispitivanje bioloških uzoraka, hemijskih jedinjenja, farmaceutskih proizvoda, veštačkih tkiva, materijala za implantologiju, i svih ostalih materijala čija nanotehnološka svojstva imaju uticaj na primenu u navedenim naučnim oblastima. Međutim, snimci dobijeni pomoću AFM-a su samo aproksimacije površina uzoraka, jer sonde nemaju ni savršenu veličinu ni geometriju, usled čega dolazi do pojave artefakata koji se definišu kao karakteristike koje se pojavljuju na snimku a koje nisu prisutne na ispitivanom uzorku. Ovi efekti izazvani konvolucijom između sonde i uzorka mogu do izvesne mere da budu korigovani matematičkom manipulacijom topografskim podacima. Metodologija koja je u ovom radu korišćena se zasniva na algebri skupova i osnovnim alatima matematičke morfologije. Iskorišćeni su matematički algoritmi za “slepu rekonstrukciju” vrhova sondi, a potom je izvršena dekonvolucija, da bi se otkrili delovi površine uzorka koji u realnosti nisu bili dostupni. Granica realnog vrha sonde se izračunava iz slike pomoću morfoloških ograničenja koja su inherentna u procesu snimanja. Rezultat se dobija u vidu snimka rekonstruisane površine uzorka iz dobijenih snimaka, uz pomoć rekonstrukcije vrha sonde kojom je uzorak sniman.One of the most perspective available technique for investigation of the composition, structure and properties of materials, is scanning probe microscopy (SPM), respectively its components scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The advantage of the method is that they have no restrictions related to origin and composition of the material, and its possibilities to investigate vide variety of materials. This technique is used in multidisciplinary research in the field of medicine, pharmacy, dentistry, material science, etc., for study of biological samples, chemical compounds, pharmaceutical products, artificial tissues, implantology materials, and all other materials that have nanotechnological impact on application in these scientific fields. However, images obtained by AFM represent only approximation of the sample surfaces. This is because the probes have not perfect size and geometry, which leads to the appearance of artifacts. They are defined as characteristics that appear on the image and are not present on the sample. These effects caused by convolutions between the probe and sample can be corrected to a certain extent by mathematical manipulation of topographic data. The methodology used in this paper is based on algebra of sets, and basic tools of mathematical morphology. Mathematical algorithms for the "blind reconstruction" of the tip were used, and then in order to detect the parts of the sample surface which is not available in real-time scanning deconvolution was applied. The limit of the real probe tip is calculated from the image, using the morphological limitations inherent in the recording process. The result acuired as an image of the reconstructed surface out of the used images, with the reconstruction of the real tip

Nanoscale magnetic Behavior of C-60 thin films in earth magnetic field under polarization light influences

Magnetic behavior of C-60 thin films in the Earths magnetic field under polarization light influence is presented. Transformation of magnetic field for two fullerene thin films of different thickness is investigated. Two proton magnetometers were used for these measurements. Samples of 30 nm and 250 nm thickness illustrate a significant change of magnetic field intensity under the influence of polarization light. in range from 3.4 to 12.9 nT, for 200 measurement data per sample

Nanoscale magnetic Behavior of C-60 thin films in earth magnetic field under polarization light influences

Magnetic behavior of C-60 thin films in the Earths magnetic field under polarization light influence is presented. Transformation of magnetic field for two fullerene thin films of different thickness is investigated. Two proton magnetometers were used for these measurements. Samples of 30 nm and 250 nm thickness illustrate a significant change of magnetic field intensity under the influence of polarization light. in range from 3.4 to 12.9 nT, for 200 measurement data per sample