11 research outputs found
Direct and Simultaneous Observation of Ultrafast Electron and Hole Dynamics in Germanium
Understanding excited carrier dynamics in semiconductors is crucial for the
development of photovoltaics and efficient photonic devices. However,
overlapping spectral features in optical/NIR pump-probe spectroscopy often
render assignments of separate electron and hole carrier dynamics ambiguous.
Here, ultrafast electron and hole dynamics in germanium nanocrystalline thin
films are directly and simultaneously observed by attosecond transient
absorption spectroscopy (ATAS) in the extreme ultraviolet at the germanium
M_{4,5}-edge (~30 eV). We decompose the ATAS spectra into contributions of
electronic state blocking and photo-induced band shifts at a carrier density of
8*10^{20}cm^{-3}. Separate electron and hole relaxation times are observed as a
function of hot carrier energies. A first order electron and hole decay of ~1
ps suggests a Shockley-Read-Hall recombination mechanism. The simultaneous
observation of electrons and holes with ATAS paves the way for investigating
few to sub-femtosecond dynamics of both holes and electrons in complex
semiconductor materials and across junctions.Comment: Includes Supplementary Informatio
Ultrafast carrier thermalization and trapping in silicon-germanium alloy probed by extreme ultraviolet transient absorption spectroscopy
Semiconductor alloys containing silicon and germanium are of growing importance for compact and highly efficient photonic devices due to their favorable properties for direct integration into silicon platforms and wide tunability of optical parameters. Here, we report the simultaneous direct and energy-resolved probing of ultrafast electron and hole dynamics in a silicon-germanium alloy with the stoichiometry Si_(0.2)5Ge_(0.75) by extreme ultraviolet transient absorption spectroscopy. Probing the photoinduced dynamics of charge carriers at the germanium M_(4,5)-edge (∼30 eV) allows the germanium atoms to be used as reporter atoms for carrier dynamics in the alloy. The photoexcitation of electrons across the direct and indirect band gap into conduction band (CB) valleys and their subsequent hot carrier relaxation are observed and compared to pure germanium, where the Ge direct (ΔE_(gap,Ge,direct) = 0.8eV) and Si_(0.25)Ge_(0.75) indirect gaps (ΔE_(gap,Si_(0.25)Ge_(0.75),indirect) = 0.95 eV) are comparable in energy. In the alloy, comparable carrier lifetimes are observed for the X, L, and Γ valleys in the conduction band. A midgap feature associated with electrons accumulating in trap states near the CB edge following intraband thermalization is observed in the Si_(0.25)Ge_(0.75) alloy. The successful implementation of the reporter atom concept for capturing the dynamics of the electronic bands by site-specific probing in solids opens a route to study carrier dynamics in more complex materials with femtosecond and sub-femtosecond temporal resolution
Ultrafast carrier thermalization and trapping in silicon-germanium alloy probed by extreme ultraviolet transient absorption spectroscopy
Semiconductor alloys containing silicon and germanium are of growing importance for compact and highly efficient photonic devices due to their favorable properties for direct integration into silicon platforms and wide tunability of optical parameters. Here, we report the simultaneous direct and energy-resolved probing of ultrafast electron and hole dynamics in a silicon-germanium alloy with the stoichiometry Si_(0.2)5Ge_(0.75) by extreme ultraviolet transient absorption spectroscopy. Probing the photoinduced dynamics of charge carriers at the germanium M_(4,5)-edge (∼30 eV) allows the germanium atoms to be used as reporter atoms for carrier dynamics in the alloy. The photoexcitation of electrons across the direct and indirect band gap into conduction band (CB) valleys and their subsequent hot carrier relaxation are observed and compared to pure germanium, where the Ge direct (ΔE_(gap,Ge,direct) = 0.8eV) and Si_(0.25)Ge_(0.75) indirect gaps (ΔE_(gap,Si_(0.25)Ge_(0.75),indirect) = 0.95 eV) are comparable in energy. In the alloy, comparable carrier lifetimes are observed for the X, L, and Γ valleys in the conduction band. A midgap feature associated with electrons accumulating in trap states near the CB edge following intraband thermalization is observed in the Si_(0.25)Ge_(0.75) alloy. The successful implementation of the reporter atom concept for capturing the dynamics of the electronic bands by site-specific probing in solids opens a route to study carrier dynamics in more complex materials with femtosecond and sub-femtosecond temporal resolution
Recommended from our members
Ultrafast carrier thermalization and trapping in silicon-germanium alloy probed by extreme ultraviolet transient absorption spectroscopy.
Semiconductor alloys containing silicon and germanium are of growing importance for compact and highly efficient photonic devices due to their favorable properties for direct integration into silicon platforms and wide tunability of optical parameters. Here, we report the simultaneous direct and energy-resolved probing of ultrafast electron and hole dynamics in a silicon-germanium alloy with the stoichiometry Si0.25Ge0.75 by extreme ultraviolet transient absorption spectroscopy. Probing the photoinduced dynamics of charge carriers at the germanium M4,5-edge (∼30 eV) allows the germanium atoms to be used as reporter atoms for carrier dynamics in the alloy. The photoexcitation of electrons across the direct and indirect band gap into conduction band (CB) valleys and their subsequent hot carrier relaxation are observed and compared to pure germanium, where the Ge direct [Formula: see text] and Si0.25Ge0.75 indirect gaps ([Formula: see text]) are comparable in energy. In the alloy, comparable carrier lifetimes are observed for the X, L, and Γ valleys in the conduction band. A midgap feature associated with electrons accumulating in trap states near the CB edge following intraband thermalization is observed in the Si0.25Ge0.75 alloy. The successful implementation of the reporter atom concept for capturing the dynamics of the electronic bands by site-specific probing in solids opens a route to study carrier dynamics in more complex materials with femtosecond and sub-femtosecond temporal resolution
Prognostic Value of Clonal Evolution at the Time of Diagnosis in Patients with Chronic Myeloid Leukemia Treated with Frontline Tyrosine Kinase Inhibitors
Characteristics and Outcomes of Older Patients with Secondary AML According to Treatment Approach
Atomic-Scale Perspective of Ultrafast Charge Transfer at a Dye–Semiconductor Interface
Understanding interfacial charge-transfer
processes on the atomic
level is crucial to support the rational design of energy-challenge
relevant systems such as solar cells, batteries, and photocatalysts.
A femtosecond time-resolved core-level photoelectron spectroscopy
study is performed that probes
the electronic structure of the interface between ruthenium-based
N3 dye molecules and ZnO nanocrystals within the first picosecond
after photoexcitation and from the unique perspective of the Ru reporter
atom at the center of the dye. A transient chemical shift of the Ru
3d inner-shell photolines by (2.3 ± 0.2) eV to higher binding
energies is observed 500 fs after photoexcitation of the dye. The
experimental results are interpreted with the aid of ab initio calculations
using constrained density functional theory. Strong indications for
the formation of an interfacial charge-transfer state are presented,
providing direct insight into a transient electronic configuration
that may limit the efficiency of photoinduced free charge-carrier
generation