10 research outputs found

    Sensitivity analysis to compute advanced stochastic problems in uncertain and complex electromagnetic environments

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    This paper deals with the advanced integration of uncertainties in electromagnetic interferences (EMI) and electromagnetic compatibility (EMC) problems.   In this context,  the Monte Carlo formalism may provide a reliable reference to proceed to statistical assessments.   After all, other  less  expensive  and  efficient  techniques  have  been implemented more recently (the unscented transform and stochastic collocation methods for instance) and will be illustrated through uncertain EMC problems. Finally, we will present how the use of sensitivity analysis techniques may offer an efficient complement to rough statistical or stochastic studies

    Sensitivity analysis to compute advanced stochastic problems in uncertain and complex electromagnetic environments

    Get PDF
    This paper deals with the advanced integration of uncertainties in electromagnetic interferences (EMI) and electromagnetic compatibility (EMC) problems.   In this context,  the Monte Carlo formalism may provide a reliable reference to proceed to statistical assessments.   After all, other  less  expensive  and  efficient  techniques  have  been implemented more recently (the unscented transform and stochastic collocation methods for instance) and will be illustrated through uncertain EMC problems. Finally, we will present how the use of sensitivity analysis techniques may offer an efficient complement to rough statistical or stochastic studies

    Effect of uncertainties on the precision of lightning studies

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    The specification of the withstand voltage of apparatuses as well as the location and characteristics of overvoltage limiting devices to be installed to protect them, requires a careful estimation of the fast front over-voltages, which might potentially exist on the system. This is usually done using an EMTP-like software program. The components of the electrical system located in the vicinity of the apparatuses under consideration are modeled to represent their high-frequency behavior. The precision on the results provided by this approach is limited by the uncertainty in the knowledge we have of key-parameters like, for instance, the value of the grounding resistance of towers or the value of the stray capacitance of some elements. We propose in this paper to examine the consequence of these uncertainties upon the precision of the final results provided by EMTP-like software program\u2019s simulations, using stochastic collocation on a practical case of lightning study

    Microwave Irradiation Affects Gene Expression in Plants

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    The physiological impact of nonionizing radiation has long been considered negligible. However, here we use a carefully calibrated stimulation system that mimics the characteristics (isotropy and homogeneity) of electromagnetic fields present in the environment to measure changes in a molecular marker (mRNA encoding the stress-related bZIP transcription factor), and show that low amplitude, short duration, 900 MHz EMF evokes the accumulation of this mRNA. Accumulation is rapid (peaking 5–15 min after stimulation) and strong (3.5-fold), and is similar to that evoked by mechanical stimulations

    Electromagnetic wave diffraction using a finite volume method

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    A temporal/frequential finite volume technique for the scattering by a complex structure

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    Communication to : 1998 international symposium on electromagnetic theory, Thessaloniki (Greece), May 25-28, 1998SIGLEAvailable from INIST (FR), Document Supply Service, under shelf-number : 22419, issue : a.1998 n.106 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc

    Antenna radiation patterns using a finite volume code

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    Communication to : JINA 96 - Journees internationales de Nice sur les antennes, Nice (France), 12-14 novembre 1996SIGLEAvailable at INIST (FR), Document Supply Service, under shelf-number : 22419, issue : a.1996 n.195 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
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