Probing the magnetic moment of FePt micromagnets prepared by Focused Ion Beam milling

We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A $1~\mu \mathrm{m} \times 8~\mu \mathrm{m}$ rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is $\mu = 1.1 \pm 0.1 \times 10 ^{-12} \mathrm{Am}^2$, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy (MRFM), that are addressed in this paper.Comment: 4 pages, 4 figure

Erbium in crystal silicon: Optical activation, excitation, and concentration limits

7 pags.; 7 figs.The optical activation, excitation, and concentration limits of erbium in crystal Si are studied. Preamorphized surface layers of Czochralski-grown (Cz) Si(100), containing 1.7×1018 O/cm3, were implanted with 250 keV Er at fluences in the range 8×1011-8×10 14 cm-2. After thermal solid-phase epitaxy of the Er-doped amorphous layers at 600°C, Er is trapped in the crystal at concentrations ranging from 3×1016 to 7×1019 Er/cm 3, as measured by secondary-ion-mass spectrometry. Photoluminescence spectra taken at 77 K show the characteristic Er3+ intra-4f luminescence at 1.54 ¿m. Photoluminescence excitation spectroscopy shows that Er is excited through a photocarrier-mediated process. Rapid thermal annealing at 1000°C for 15 s increases the luminescence intensity, mainly due to an increase in minority-carrier lifetime, which enhances the excitation efficiency. Luminescent Er forms clusters with oxygen: the maximum Er concentration that can be optically activated is determined by the O content, and is (3±1)×1017 Er/cm3 in Cz-Si. The internal quantum efficiency for electrical excitation of Er in Cz-Si is larger than 3×10-6. © 1995 American Institute of Physics.This work is part of the research program of the Foundation for Fundamental Research on Matter (FOM) and was made possible by financial support from the Dutch Organization for the Advancement of Pure Research @IWO), the Netherlands Technology Foundation (STW), and the IC Technology Program (IOP Electra-Optics) of the Ministry of Economic Affairs. R.S. acknowIedges financial support from CSIC, Spain.Peer Reviewe

Polarization tomography of metallic nanohole arrays

We report polarization tomography experiments on metallic nanohole arrays with square and hexagonal symmetry. As a main result, we find that a fully polarized input beam is partly depolarized after transmission through a nanohole array. This loss of polarization coherence is found to be anisotropic, i.e. it depends on the polarization state of the input beam. The depolarization is ascribed to a combination of two factors: i) the nonlocal response of the array due to surface plasmon propagation, ii) the non-plane wave nature of a practical input beam.Comment: 4 pages, 3 figures, 1 table, submitted to PR

Mapping Patent Classifications: Portfolio and Statistical Analysis, and the Comparison of Strengths and Weaknesses

The Cooperative Patent Classifications (CPC) jointly developed by the European and US Patent Offices provide a new basis for mapping and portfolio analysis. This update provides an occasion for rethinking the parameter choices. The new maps are significantly different from previous ones, although this may not always be obvious on visual inspection. Since these maps are statistical constructs based on index terms, their quality--as different from utility--can only be controlled discursively. We provide nested maps online and a routine for portfolio overlays and further statistical analysis. We add a new tool for "difference maps" which is illustrated by comparing the portfolios of patents granted to Novartis and MSD in 2016.Comment: Scientometrics 112(3) (2017) 1573-1591; http://link.springer.com/article/10.1007/s11192-017-2449-