81 research outputs found

    Industrial Internet of Things, Big Data, and Artificial Intelligence in the Smart Factory: a survey and perspective

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    International audienceThanks to the rapid development and applications of advanced technologies, we are experiencing the fourth industrial revolution, or Industry 4.0, which is a revolution towards smart manufacturing. The wide use of cyber physical systems and Internet of Things leads to the era of Big Data in industrial manufacturing. Artificial Intelligence algorithms emerge as powerful analytics tools to process and analyze the Big Data. These advanced technologies result in the introduction of a new concept in the Industry 4.0: the smart Factory. In order to fully understand this new concept in the context of the Industry 4.0, this paper provides a survey on the key components of a smart factory and the link between them, including the Industrial Internet of Things, Big Data and Artificial Intelligence. Several studies and techniques that are used to enable smart manufacturing are reviewed. Finally, we discuss some perspectives for further researches

    Estimating process capability index Cpm using a bootstrap sequential sampling procedure

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    Construction of a confidence interval for process capability index CPM is often based on a normal approximation with fixed sample size. In this article, we describe a different approach in constructing a fixed-width confidence interval for process capability index CPM with a preassigned accuracy by using a combination of bootstrap and sequential sampling schemes. The optimal sample size required to achieve a preassigned confidence level is obtained using both two-stage and modified two-stage sequential procedures. The procedure developed is also validated using an extensive simulation study.<br /

    A new CUSUM‐ S

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    Conditional design of the CUSUM median chart for the process position when process parameters are unknown

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    Performance of the hotelling T 2 control chart for compositional data in the presence of measurement errors

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