47 research outputs found
Influence of substrate bias on the structural and dielectrical properties of magnetron-sputtered BaxSr1-xTiO3 thin films
Full text linkThe application of a substrate bias during rf magnetron sputtering alters the
crystalline structure, grain morphology, lattice strain and composition of
BaxSr1-xTiO3 thin films. As a result, the dielectric properties of
Pt/BaxSr1-xTiO3/Pt parallel-plate capacitors change significantly. With
increasing substrate bias we observe a clear shift of the ferroelectric to
paraelectric phase transition towards higher temperature, an increase of the
dielectric permittivity and tunability at room temperature, and a deterioration
of the dielectric loss. To a large extent these changes correlate to a gradual
increase of the tensile in-plane film strain with substrate bias and an abrupt
change in film composition.Comment: 24 pages, 8 figures, submitted to Ferroelectric
A prospective randomised radiostereometric analysis trial of SmartSet HV and Palacos R bone cements in primary total hip arthroplasty
Get PDFCytokine patterns in nasal secretion of non-atopic patients distinguish between chronic rhinosinusitis with or without nasal polys
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Effect of soil compaction on transpiration and height increment of planted Scots pine seedlings.
No full textSelf-assembly of cationic rod-like poly(2,5-pyridine) by acidic bis(trifluoromethane)sulfonimide in the hydrated state:A highly-ordered self-assembled protonic conductor
No full textInfluence of the seed layer on the crystalline structure and piezoelectric properties of sputter-deposited AlN-films
No full textInfluence of the seed layer on the crystalline structure and piezoelectric properties of sputter-deposited AlN-films
No full textInfluence of the seed layer on structural and electro-acoustic properties of sputter-deposited AlN resonators
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