Covid-19 Pandemic Policy Monitor (COV-PPM) - European level tracking data of non-pharmaceutical interventions

Bozorgmehr K, Rohleder S, Duwendag S, et al. Covid-19 Pandemic Policy Monitor (COV-PPM) - European level tracking data of non-pharmaceutical interventions. Data in Brief. 2021;39: 107579.The Covid-19 Pandemic Policy Monitor (COV-PPM) dataset prospectively documents non-pharmaceutical interventions (NPIs) taken to contain SARS-Cov-2 transmission across countries in EU27, EEA and UK. In Germany, measures have also been recorded at the federal state and, partially, at the district levels. NPIs implemented since January 2020 have been retrieved and updated weekly from March 2020, from official governments webpages, Ministries of Health, National (Public) Health Institutes or Administrations. NPI categories collected refer to restrictions, closures or changes in functioning implemented in 13 domains: public events (gatherings in indoor or outdoor spaces); public institutions (kindergartens, schools, universities); public spaces (shops, bars, restaurants); public transport (trains, buses, trams, metro); citizens movement/mobility (e.g. pedestrians, cars, ships); border closures (air, land or sea, all incoming travels, from high-risk regions, only non-nationals); measures to improve the healthcare system (e.g. human resources or technical reinforcement, redistribution, material or infrastructural); measures for risk/vulnerable groups (e.g. elderly, chronically ill, pregnant); economic measures (e.g. lay-off rules establishment, actions to avoid job-loss, tax relaxation); testing policies (e.g. testing criteria changes); nose and mouth protection rules, vaccination and others/miscellaneous measures

Röntgenspektrometrie mit Synchrotronstrahlung

PTB-Mitteilungen. Band 124 (2014), Heft 4, Seite 17 - 23. ISSN 0030-834

Complementary Metrology within a European Joint Laboratory

The continuous dimensional reduction drives the development of metrology, analysis and characterization for nano and micro electronics. An enormous worldwide R&D effort focuses on the understanding and controlling materials properties and dimensions at atomic level. Crucial for groundbreaking new developments is the availability of appropriate analytical infrastructures providing techniques with information depths well adapted to the nanoscaled objects of interest. This requires widely accessible, independent complementary metrology, analytical techniques, and characterization. For example new materials and the demand of improved detection sensitivities for contaminants provide huge challenges for the capabilities of current analysis equipment and expertise. At the same time, the availability of complementary competences is crucial for advancement of analytical methodologies through cross-comparison, round-robin, and benchmarking of results. This paper describes the formation of an independent analytical infrastructure within Europe having the expertise and competence to solve metrology problems for development of nanotechnologies. Furthermore, a strategy is shown to establish independently operating ‘Golden Laboratories’ for complementary and reliable metrology, analysis, and characterization adapted to the requirements of industrial partner

Highly Sensitive Detection of Inorganic Contamination

As the detection of inorganic contaminants is of steadily increasing importance for the improvement of yields in microelectronic applications, the aim of one of the joint research activity within the European Integrated Activity of Excellence and Networking for Nano- and Micro-Electronics Analysis (ANNA, site: www.ANNA-i3.org) is the development and assessment of new methodologies and metrologies for the detection of low concentration inorganic contaminants in silicon and in novel materials. A main objective consist in the benchmarking of various analytical techniques available in the laboratories of the participating ANNA partners, including the improvement of the respective detection limits as well as the quantitation reliablity of selected analytical techniques such as total-reflection x-ray fluorescence (TXRF) analysi

Metrologie mit Synchrotronstrahlung, Teil II (Auszug aus: PTB-Mitteilungen 2014, Band 124, Heft 4. ISSN 0030-834X)

PTB-Mitteilungen. Band 124 (2014), Heft 4. ISSN 0030-834X1.: Scholze, Frank, Christian Laubis, Annett Barboutis, Christian Buchholz, Andreas Fischer, Jana Puls und Christian Stadelhoff: Radiometrie für die EUV-Lithographie. doi: 10.7795/310.20140401 http://dx.doi.org/10.7795/210.20140401 2.: Scholze, Frank, Anton Haase, Michael Krumrey, Victor Soltwisch und Jan Wernecke: Streuverfahren an nanostrukturierten Oberflächen. doi: 10.7795/310.20140402 http://dx.doi.org/10.7795/310.20140402 3.: Krumrey, Michael, Raul Garcia-Diez, Christian Gollwitzer und Stefanie Langner: Größenbestimmung von Nanopartikeln mit Röntgenkleinwinkelstreuung. doi: 10.7795/310.20140403 http://dx.doi.org/10.7795/310.20140403 4.: Müller, Matthias, Martin Gerlach, Ina Holfelder, Philipp Hönicke, Janin Lubeck, Andreas Nutsch, Beatrix Pollakowski, Cornelia Streeck, Rainer Unterumsberger, Jan Weser und Burkhard Beckhoff: Röntgenspektrometrie mit Synchrotronstrahlung. doi: 10.7795/310.20140404 http://dx.doi.org/10.7795/210.20140404 5.: Hermann, Peter, Arne Hoehl, Andrea Hornemann, Bernd Kästner, Ralph Müller, Burkhard Beckhoff und Gerhard Ulm: Mikro- und Nano-Spektroskopie und Detektorcharakterisierung im IR- und THz-Bereich an der Metrology Light Source. doi: 10.7795/310.20140405 http://dx.doi.org/10.7795/310.20140405 6.: Kolbe, Michael, Erik Darlatt, Rolf Fliegauf, Hendrik Kaser, Alexander Gottwald und Mathias Richter: Oberflächenuntersuchungen mit Vakuum-UV-Strahlung. doi: 10.7795/310.20140406 http://dx.doi.org/10.7795/310.2014040