3 research outputs found

    Exploring the Mysteries of System-Level Test

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    System-level test, or SLT, is an increasingly important process step in today's integrated circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in operational modes. In this paper, we consolidate available knowledge about what SLT is precisely and why it is used despite its considerable costs and complexities. We discuss the types or failures covered by SLT, and outline approaches to quality assessment, test generation and root-cause diagnosis in the context of SLT. Observing that the theoretical understanding for all these questions has not yet reached the level of maturity of the more conventional structural and functional test methods, we outline new and promising directions for methodical developments leveraging on recent findings from software engineering.Comment: 7 pages, 2 figure

    A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors

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    With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks

    Security, reliability and test aspects of the RISC-V ecosystem

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    RISC-V has emerged as a viable solution on academia and industry. However, to use open source hardware for safety-critical applications, we need a deep understanding of the way in which well established mechanisms for testing and reliability could be integrated and deployed on the RISCV ecosystem, and we need a clear knowledge on how such an ecosystem can be leveraged to improve security. This paper includes four contributions presenting the potential of RISC-V in security research, the way in which RISC-V can be hardened against power analysis attacks, how to implement, using RISCV, software and hardware/software solutions for dual core lock step, and how to perform system-level testing in the RISC-V ecosystem.Peer ReviewedPostprint (published version
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