Raman spectroscopy and polarization: Selected case studies

International audienceWe show, through several selected case studies, the potential benefits that can be obtained by controlling the polarization states of the exciting and scattered radiations in a Raman scattering experiment. When coupled with polarization control, Raman spectroscopy is thus capable of providing extra information on the structural properties of the materials under investigation. The experimental examples presented in this work are taken from the area of both conventional, i.e., far-field, as well as from near-field Raman spectroscopy. They cover topics such as the stress tensor measurement in strained semiconductor structures, the vibration mode assignment in pentacene thin films and the Raman scattering tensor determination from near-field measurements on azobenzene monolayers. The basic theory necessary for modelling the far- and near-field polarized Raman responses is also given and the model efficiency is illustrated on the experimental data

Retardation assisted enhanced Raman scattering from silicon nanostripes in the visible range

International audiencePatterned silicon on insulator structures representing evenly spaced parallel 15 nm-thick nanostripes exhibit an enhanced Raman scattering response when excited in the visible range in an oblique incidence backscattering configuration. The enhancement phenomenon in two structures having different stripe widths, 200 and 50 nm, is investigated at various sample azimuthal orientations, excitation radiation polarizations as well as laser wavelengths and is shown to be of resonant nature. The enhanced Raman response of the patterned structures is attributed to the presence of Mie resonances, essentially resulting in the enhancement of the internal electric field within the nanostripes. It is quantitatively described in terms of the spheroid particle model extended beyond the electrostatic limit to include field retardation effects that are shown to be responsible for the resonant behaviour in the visible range

Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films

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