29 research outputs found

    Application of the method of auxiliary sources in optical diffraction microscopy

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    The Method of Auxiliary Sources is used for characterisation of grating defects. Grating profiles are characterised by best fit matching of a library of diffraction efficiencies with numerical simulated diffraction efficiencies with defects. It is shown that the presented method can solve the inverse problem with an accuracy usually thought to require rigorous electromagnetic theories

    Use of the LM-OSL technique for the detection of partial bleaching in quartz

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    We present a study of the sensitivity to light (ease-of-bleaching) of the trapped charge in sedimentary quartz grains using an optically stimulated luminescence (OSL) technique in which the intensity of the stimulation light is linearly increased during the measurement period. The technique is known as linear modulation OSL (LM-OSL). In controlled laboratory conditions, this technique has been employed to study the ease-of-bleaching of the trapped charge in quartz by comparing the OSL curves of quartz aliquots which have been either: (1) fully bleached, followed by a laboratory dose of beta -irradiation, or (2) partially bleached, followed by the laboratory beta -dose. The ratio of the OSL signals due to the beta -dose from the partly and fully bleached aliquots is illustrated to be a potential indicator of the degree of optical resetting of the OSL signal in dating material. The key parameter governing the ease-of-bleaching is the photoionization cross-section of the trap involved. The concept is also demonstrated in a model study from which very good agreement with the experimental observations has been found. Potential applications of the technique to dating are discussed
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