Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartz

Direct current glow discharge mass spectrometry with an indium-based secondary cathode technique is used to analyze solid, nonconducting, fused high-purity quartz regarding metallic impurities of relevance to the solar industry. Details of the analytical routines are presented. In this work, the secondary cathode design and glow discharge conditions are optimized beyond the commonly applied practices. In addition, relative sensitivity factors (RSFs) for these optimized conditions are established and compared to previously published results. The results indicate that the technique enables stable measurements with detection limits down to the part per billion (ppb) range.publishedVersio

Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartz

Direct current glow discharge mass spectrometry with an indium-based secondary cathode technique is used to analyze solid, nonconducting, fused high-purity quartz regarding metallic impurities of relevance to the solar industry. Details of the analytical routines are presented. In this work, the secondary cathode design and glow discharge conditions are optimized beyond the commonly applied practices. In addition, relative sensitivity factors (RSFs) for these optimized conditions are established and compared to previously published results. The results indicate that the technique enables stable measurements with detection limits down to the part per billion (ppb) range

Application of 7N In as secondary cathode for the dc‐GDMS analysis of solid, fused high‐purity quartz

Direct current glow discharge mass spectrometry with an indium-based secondary cathode technique is used to analyze solid, nonconducting, fused high-purity quartz regarding metallic impurities of relevance to the solar industry. Details of the analytical routines are presented. In this work, the secondary cathode design and glow discharge conditions are optimized beyond the commonly applied practices. In addition, relative sensitivity factors (RSFs) for these optimized conditions are established and compared to previously published results. The results indicate that the technique enables stable measurements with detection limits down to the part per billion (ppb) range

Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartz

Direct current glow discharge mass spectrometry with an indium-based secondary cathode technique is used to analyze solid, nonconducting, fused high-purity quartz regarding metallic impurities of relevance to the solar industry. Details of the analytical routines are presented. In this work, the secondary cathode design and glow discharge conditions are optimized beyond the commonly applied practices. In addition, relative sensitivity factors (RSFs) for these optimized conditions are established and compared to previously published results. The results indicate that the technique enables stable measurements with detection limits down to the part per billion (ppb) range

Combining HAADF STEM tomography and electron diffraction for studies of α-Al(Fe,Mn)Si dispersoids in 3xxx aluminium alloys

<div><p>A new methodology to study the precipitation crystallography of dispersoids in an Al matrix is proposed. By combining high angle annular dark field tomography and electron diffraction studies, the three-dimensional morphology, orientation relationship (OR) with Al matrix and habit planes of the dispersoids can be achieved simultaneously. This approach has been applied to investigate the -Al(Mn,Fe)Si dispersoids precipitated in an AA3xxx alloy. Most dispersoids have a plate-shaped morphology after low-temperature homogenization at 450C. The largest proportion of the dispersoids follows the previously described OR with the Al matrix . Two plate-shaped dispersoids have been studied in detail. The dispersoid following the commonly observed orientation had habit planes . The dispersoid not following the commonly observed OR had habit planes , with (OR) , .</p></div