24 research outputs found
Charge Trapping States at the SiO<sub>2</sub>–Oligothiophene Monolayer Interface in Field Effect Transistors Studied by Kelvin Probe Force Microscopy
Using Kelvin probe force microscopy (KPFM) we studied the local charge trapping states at the SiO<sub>2</sub>–oligothiophene interface in a field effect transistor (FET), where SiO<sub>2</sub> is the gate dielectric. KPFM reveals surface potential inhomogeneities within the oligothiophene monolayer, which correlate with its structure. A large peak of trap states with energies in the oligothiophene’s band gap due to hydroxyl groups is present at the oxide surface. We show that these states are successfully eliminated by preadsorption of a layer of (3-aminopropyl)triethoxysilane (APTES). Time-resolved surface potential transient measurements further show that the charge carrier injection in the nonpassivated FET contains two exponential transients, due to the charge trapping on the oxide surface and in the bulk oxide, while the APTES-passivated FET has only a single-exponential transient due to the bulk oxide. The results demonstrate that APTES is a good SiO<sub>2</sub> surface passivation layer to reduce trap states while maintaining a hydrophilic surface, pointing out the importance of dielectric surface passivation to bridge the gap between soft materials and electronic devices
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Dynamic Charge Carrier Trapping in Quantum Dot Field Effect Transistors
Noncrystalline semiconductor materials
often exhibit hysteresis in charge transport measurements whose mechanism
is largely unknown. Here we study the dynamics of charge injection
and transport in PbS quantum dot (QD) monolayers in a field effect
transistor (FET). Using Kelvin probe force microscopy, we measured
the temporal response of the QDs as the channel material in a FET
following step function changes of gate bias. The measurements reveal
an exponential decay of mobile carrier density with time constants
of 3–5 s for holes and ∼10 s for electrons. An Ohmic
behavior, with uniform carrier density, was observed along the channel
during the injection and transport processes. These slow, uniform
carrier trapping processes are reversible, with time constants that
depend critically on the gas environment. We propose that the underlying
mechanism is some reversible electrochemical process involving dissociation
and diffusion of water and/or oxygen related species. These trapping
processes are dynamically activated by the injected charges, in contrast
with static electronic traps whose presence is independent of the
charge state. Understanding and controlling these processes is important
for improving the performance of electronic, optoelectronic, and memory
devices based on disordered semiconductors
Superlubric Sliding of Graphene Nanoflakes on Graphene
The lubricating properties of graphite and graphene have been intensely studied by sliding a frictional force microscope tip against them to understand the origin of the observed low friction. In contrast, the relative motion of free graphene layers remains poorly understood. Here we report a study of the sliding behavior of graphene nanoflakes (GNFs) on a graphene surface. Using scanning tunneling microscopy, we found that the GNFs show facile translational and rotational motions between commensurate initial and final states at temperatures as low as 5 K. The motion is initiated by a tip-induced transition of the flakes from a commensurate to an incommensurate registry with the underlying graphene layer (the superlubric state), followed by rapid sliding until another commensurate position is reached. Counterintuitively, the average sliding distance of the flakes is larger at 5 K than at 77 K, indicating that thermal fluctuations are likely to trigger their transitions from superlubric back to commensurate ground states
Tolerance of Intrinsic Defects in PbS Quantum Dots
Colloidal
quantum dots exhibit various defects and deviations from
ideal structures due to kinetic processes, although their band gap
frequently remains open and clean. In this Letter, we computationally
investigate intrinsic defects in a real-size PbS quantum dot passivated
with realistic Cl-ligands. We show that the colloidal intrinsic defects
are ionic in nature. Unlike previous computational results, we find
that even nonideal, atomically nonstoichiometric quantum dots have
a clean band gap without in-gap-states provided that quantum dots
satisfy electronic stoichiometry
Catalyst Chemical State during CO Oxidation Reaction on Cu(111) Studied with Ambient-Pressure X‑ray Photoelectron Spectroscopy and Near Edge X‑ray Adsorption Fine Structure Spectroscopy
The
chemical structure of a Cu(111) model catalyst during the CO
oxidation reaction in the CO+O<sub>2</sub> pressure range of 10–300
mTorr at 298–413 K was studied <i>in situ</i> using
surface sensitive X-ray photoelectron and adsorption spectroscopy
techniques [X-ray photoelectron spectroscopy (XPS) and near edge X-ray
adsorption fine structure spectroscopy (NEXAFS)]. For O<sub>2</sub>:CO partial pressure ratios below 1:3, the surface is covered by
chemisorbed O and by a thin (∼1 nm) Cu<sub>2</sub>O layer,
which covers completely the surface for ratios above 1:3 between 333
and 413 K. The Cu<sub>2</sub>O film increases in thickness and exceeds
the escape depth (∼3–4 nm) of the XPS and NEXAFS photoelectrons
used for analysis at 413 K. No CuO formation was detected under the
reaction conditions used in this work. The main reaction intermediate
was found to be CO<sub>2</sub><sup>δ−</sup>, with a coverage
that correlates with the amount of Cu<sub>2</sub>O, suggesting that
this phase is the most active for CO oxidation
Internal and External Atomic Steps in Graphite Exhibit Dramatically Different Physical and Chemical Properties
We report on the physical and chemical properties of atomic steps on the surface of highly oriented pyrolytic graphite (HOPG) investigated using atomic force microscopy. Two types of step edges are identified: internal (formed during crystal growth) and external (formed by mechanical cleavage of bulk HOPG). The external steps exhibit higher friction than the internal steps due to the broken bonds of the exposed edge C atoms, while carbon atoms in the internal steps are not exposed. The reactivity of the atomic steps is manifested in a variety of ways, including the preferential attachment of Pt nanoparticles deposited on HOPG when using atomic layer deposition and KOH clusters formed during drop casting from aqueous solutions. These phenomena imply that only external atomic steps can be used for selective electrodeposition for nanoscale electronic devices
Scanning Tunneling Microscopy Study of the Structure and Interaction between Carbon Monoxide and Hydrogen on the Ru(0001) Surface
We
use scanning tunneling microscopy (STM) to investigate the spatial
arrangement of carbon monoxide (CO) and hydrogen (H) coadsorbed on
a model catalyst surface, Ru(0001). We find that at cryogenic temperatures,
CO forms small triangular islands of up to 21 molecules with hydrogen
segregated outside of the islands. Furthermore, whereas for small
island sizes (3–6 CO molecules) the molecules adsorb at <i>hcp</i> sites, a registry shift toward <i>top</i> sites
occurs for larger islands (10–21 CO molecules). To characterize
the CO structures better and to help interpret the data, we carried
out density functional theory (DFT) calculations of the structure
and simulations of the STM images, which reveal a delicate interplay
between the repulsions of the different species
Reaction of CO with Preadsorbed Oxygen on Low-Index Copper Surfaces: An Ambient Pressure X‑ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy Study
The
reaction of CO with chemisorbed oxygen on three low-index faces
of copper was studied using ambient pressure X-ray photoelectron spectroscopy
(XPS) and high-pressure scanning tunneling microscopy. At room temperature,
the chemisorbed oxide can be removed by reaction with gas-phase CO
in the 0.01–0.20 Torr pressure range. The reaction rates were
determined by measuring the XPS peak intensities of O and CO as a
function of time, pressure, and temperature. On Cu(111) the rate was
found to be one order of magnitude faster than that on Cu(100) and
two orders of magnitude faster than that on Cu(110). The apparent
activation energies for CO oxidation were measured as 0.24 eV for
O/Cu(111), 0.29 eV for O/Cu(100), and 0.51 eV for O/Cu(110) in the
temperature range between 298 and 473 K. These energies are correlated
to the oxygen binding energies on each surface
Revealing Correlation of Valence State with Nanoporous Structure in Cobalt Catalyst Nanoparticles by <i>In Situ</i> Environmental TEM
Simultaneously probing the electronic structure and morphology of materials at the nanometer or atomic scale while a chemical reaction proceeds is significant for understanding the underlying reaction mechanisms and optimizing a materials design. This is especially important in the study of nanoparticle catalysts, yet such experiments have rarely been achieved. Utilizing an environmental transmission electron microscope equipped with a differentially pumped gas cell, we are able to conduct nanoscopic imaging and electron energy loss spectroscopy <i>in situ</i> for cobalt catalysts under reaction conditions. Studies reveal quantitative correlation of the cobalt valence states with the particles’ nanoporous structures. The <i>in situ</i> experiments were performed on nanoporous cobalt particles coated with silica, while a 15 mTorr hydrogen environment was maintained at various temperatures (300–600 °C). When the nanoporous particles were reduced, the valence state changed from cobalt oxide to metallic cobalt and concurrent structural coarsening was observed. <i>In situ</i> mapping of the valence state and the corresponding nanoporous structures allows quantitative analysis necessary for understanding and improving the mass activity and lifetime of cobalt-based catalysts, for example, for Fischer–Tropsch synthesis that converts carbon monoxide and hydrogen into fuels, and uncovering the catalyst optimization mechanisms
In Situ Scanning Tunneling Microscopy and X‑ray Photoelectron Spectroscopy Studies of Ethylene-Induced Structural Changes on the Pt(100)-hex Surface
We have studied the structures of the Pt(100) surface
in the presence
of gas-phase ethylene at room temperature. High-pressure scanning
tunneling microscopy shows that the hexagonal reconstruction on the
clean Pt(100) surface is preserved under 1 Torr of C<sub>2</sub>H<sub>4</sub>, which produces an ethylidyne and di-σ-bonded ethylene
saturated surface. At 5 × 10<sup>–6</sup> Torr of C<sub>2</sub>H<sub>4</sub>, coadsorbed CO from the background gases lifts
the reconstruction, with the excess Pt atoms from the hexagonal surface
forming islands on the surface. The chemisorption of CO from background
gases in the vacuum system, in the nominally pure C<sub>2</sub>H<sub>4</sub>, is revealed by ambient-pressure X-ray photoelectron spectroscopy