448 research outputs found

    A simple one-dimensional model for the explanation and analysis of GaAs MESFET behavior

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    The explanation of GaAs metal-semiconductor field effect transistor (MESFET) operation often involves the use of simplistic analytical formulae, which serve to obscure the more subtle physics of device action. The authors consider here a simple one-dimensional (1-D) model for GaAs MESFETs, which avoids more confusing numerical modeling schemes, yet still facilitates an analysis of the physical functionality of the device. The model takes into account current saturation due to either velocity saturation or channel pinch-off, the modulation of effective gate length and the series resistance of the regions beyond the gate. The results of the model have been compared to experimental data readily obtained from the literature, and the agreement has been shown to be goo

    Novel nonalloyed thermally stable Pd/Sn and Pd/Sn/Au ohmic contacts for the fabrication of GaAs MESFETs

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    GaAs metal-semiconductor field-effect transistors (MESFETs) have been fabricated utilizing thermally stable Pd/Sn and Pd/Sn/Au ohmic contacts for the first time. MESFETs with Pd/Ge ohmic contacts are fabricated for comparison. The thermal stability of the Pd/Sn, Pd/Ge and Pd/Sn/Au ohmic contacts is also presente

    MUSI 195.13: Applied Study - String Bass

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    MUSI 102A.15: Performance Study - Bass

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    MUSI 495.13: Applied Study IV- String Bass

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    MUSI 295.13: Applied Study - String Bass

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    MUSI 395.13: Applied Study III - String Bass

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    Space station attitude disturbance arising from internal motions

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    A source of space station attitude disturbances is identified. The attitude disturbance is driven by internal space station motions and is a direct result of conservation of angular momentum. Three examples are used to illustrate the effect: a planar three link system, a rigid carrier body with two moveable masses, and a nonplanar five link system. Simulation results are given to show the magnitude of the attitude change in each example. Factors which accentuate or attenuate this disturbance effect are discussed

    Comprehensive investigation of Ge-Si bonded interfaces using oxygen radical activation

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    In this work, we investigate the directly bonded germanium-silicon interfaces to facilitate the development of high quality germanium silicon hetero integration at the wafer scale. X-ray photoelectron spectroscopy data is presented which provides the chemical composition of the germanium surfaces as a function of the hydrophilic bonding reaction at the interface. The bonding process induced long range deformation is detected by synchrotron x-ray topography. The hetero-interface is characterized by measuring forward and reverse current, and by high resolution transmission electron microscopy. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3601355
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