6 research outputs found

    Spectroscopic perspective on the interplay between electronic and magnetic properties of magnetically doped topological insulators

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    We combine low energy muon spin rotation (LE-μ\muSR) and soft-X-ray angle-resolved photoemission spectroscopy (SX-ARPES) to study the magnetic and electronic properties of magnetically doped topological insulators, (Bi,Sb)2_2Te3_3. We find that one achieves a full magnetic volume fraction in samples of (V/Cr)x_x(Bi,Sb)2−x_{2-x}Te3_3 at doping levels x ≳\gtrsim 0.16. The observed magnetic transition is not sharp in temperature indicating a gradual magnetic ordering. We find that the evolution of magnetic ordering is consistent with formation of ferromagnetic islands which increase in number and/or volume with decreasing temperature. Resonant ARPES at the V L3L_3 edge reveals a nondispersing impurity band close to the Fermi level as well as V weight integrated into the host band structure. Calculations within the coherent potential approximation of the V contribution to the spectral function confirm that this impurity band is caused by V in substitutional sites. The implications of our results on the observation of the quantum anomalous Hall effect at mK temperatures are discussed

    Structure, reactivity, electronic configuration and magnetism of samarium atomic layers deposited on Si(001) by molecular beam epitaxy

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    The surface structure, interface reactivity, electron configuration and magnetic properties of Sm layers deposited on Si(0 0 1) at various temperatures are investigated by low-energy electron diffraction (LEED), X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (XAS) and magneto-optical Kerr effect (MOKE). It is found that metal Sm is present on samples prepared at low temperature, with an interface layer containing SmSi2 and Sm4Si3. When samples are prepared at high temperature, much less metal Sm is found, with an increasing amount of SmSi2. Room temperature ferromagnetism is observed for all prepared layers, with a decrease of the saturation magnetization when samples are prepared at high temperature. It is found that ferromagnetism implies mostly a compound with approximate stoichiometry Sm4Si3. Also, the decrease in the intensity of the XAS 2p3/2 → 3d white lines with the corresponding increasing amount of SmSi2 may be explained by assuming a higher occupancy of Sm 5d orbitals (5d2 configuration), most probably due to hybridation effects

    Impact of band-bending on the k-resolved electronic structure of Si-doped GaN

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    Band bending at semiconductor surfaces and interfaces is the key to applications ranging from classical transistors to topological quantum computing. A semiconductor particularly important for optical as well as microwave devices is GaN. What makes the material useful is not only its large bandgap but also that it can be heavily doped to become metallic. Here, we apply soft-x-ray angle-resolved photoelectron spectroscopy (ARPES) to metallic Si-doped GaN to explore the electron density and momentum-resolved band dispersions of the valence and conduction electrons varying through the surface band-bending region. We find an upward band bending, where the measured band occupation reduces toward the surface, as probed with low photon energies 1.4 keV, where the photoelectron mean free path exceeds the spatial extent of the band-bending region. Our quantitative analysis of the experimental data describes the potential variation in the band-bending region via self-consistent Poisson-Schrödinger equations. We put forward an insightful model to simulate the ARPES spectra from this region through summing up the contribution from all atomic layers, weighted by the photoelectron mean free path, under in-phase conditions achieved at particular values of the photoelectron out-of-plane momentum. The model adequately describes the peculiarities of the ARPES spectra caused by the surface band bending, including the photon-energy dependence of the apparent band occupation and Fermi-surface area, and allows accurate determination of the band-bending profile and values of the photoelectron mean free path. Finally, comparison of our data with supercell density functional theory calculations reveals the preferential location of Si atoms as substitutional for Ga, with the doped electrons entering the GaN conduction bands without formation of separate impurity states as would occur for Si interstitials. Our theoretical and experimental results resolve fundamental questions underpinning device performance of the GaN-based and other semiconductor materials in general and demonstrate a general methodology for quantitative studies of electron states in the band-bending region.ISSN:2643-156

    Thickness Influence on In Vitro Biocompatibility of Titanium Nitride Thin Films Synthesized by Pulsed Laser Deposition

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    We report a study on the biocompatibility vs. thickness in the case of titanium nitride (TiN) films synthesized on 410 medical grade stainless steel substrates by pulsed laser deposition. The films were grown in a nitrogen atmosphere, and their in vitro cytotoxicity was assessed according to ISO 10993-5 [1]. Extensive physical-chemical analyses have been carried out on the deposited structures with various thicknesses in order to explain the differences in biological behavior: profilometry, scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy (XPS), X-ray diffraction and surface energy measurements. XPS revealed the presence of titanium oxynitride beside TiN in amounts that vary with the film thickness. The cytocompatibility of films seems to be influenced by their TiN surface content. The thinner films seem to be more suitable for medical applications, due to the combined high values of bonding strength and superior cytocompatibility

    Double band inversion in α -Sn: Appearance of topological surface states and the role of orbital composition

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    The electronic structure of \graySn(001) thin films strained compressively in-plane was studied both experimentally and theoretically. A new topological surface state (TSS) located entirely within the gapless projected bulk bands is revealed by \textit{ab initio}-based tight-binding calculations as well as directly accessed by soft X-ray angle-resolved photoemission. The topological character of this state, which is a surface resonance, is confirmed by unravelling the band inversion and by calculating the topological invariants. In agreement with experiment, electronic structure calculations show the maximum density of states in the subsurface region, while the already established TSS near the Fermi level is strongly localized at the surface. Such varied behavior is explained by the differences in orbital composition between the specific TSS and its associated bulk states, respectively. This provides an orbital protection mechanism for topological states against mixing with the background of bulk bands
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