Tunneling images of a 2D electron system in a quantizing magnetic field

We have applied a scanning probe method, Subsurface Charge Accumulation (SCA) imaging, to resolve the local structure of the interior of a semiconductor two-dimensional electron system (2DES) in a tunneling geometry. Near magnetic fields corresponding to integer Landau level filling, submicron scale spatial structure in the out-of-phase component of the tunneling signal becomes visible. In the images presented here, the structure repeats itself when the filling factor is changed from nu=6 to nu=7. Therefore, we believe the images reflect small modulations in the 2DES density caused by the disorder in the sample.Comment: 2 pages, 2 color figures, submitted to LT23 proceeding

Is the `Finite Bias Anomaly' in planar GaAs-Superconductor junctons caused by point-contact like structures?

We correlate transmission electron microscope (TEM) pictures of superconducting In contacts to an AlGaAs/GaAs heterojunction with differential conductance spectroscopy performed on the same heterojunction. Metals deposited onto a (100) AlGaAs/GaAs heterostructure do not form planar contacts but, during thermal annealing, grow down into the heterostructure along crystallographic planes in pyramid-like `point contacts'. Random surface nucleation and growth gives rise to a different interface transmission for each superconducting point contact. Samples annealed for different times, and therefore having different contact geometry, show variations in $dI/dV$ characteristic of ballistic transport of Cooper pairs, wave interference between different point emitters, and different types of weak localization corrections to Giaever tunneling. We give a possible mechanism whereby the `finite bias anomaly' of Poirier et al. (Phys. Rev. Lett., {\bf 79}, 2105 (1997)), also observed in these samples, can arise by adding the conductance of independent superconducting point emitters in parallel

Detection of picosecond electrical transients in a scanning tunneling microscope

Contains fulltext : 29419.pdf (publisher's version ) (Open Access

New optoelectronic tip design for ultrafast scanning tunneling microscopy

Contains fulltext : 29418___.PDF (publisher's version ) (Open Access