14 research outputs found
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Latent interface traps and 1/f noise in irradiated MOS devices
Get PDFA delayed increase in 1/f noise is observed for pMOS transistors showing latent radiation-induced interface-trap buildup. The latent interface traps and increased noise appear to result from the same thermally activated process, likely involving hydrogen
Defining standards and core outcomes for clinical trials in prehabilitation for colorectal surgery (DiSCO): modified Delphi methodology to achieve patient and healthcare professional consensus
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Oxide coarsening and its influence on recrystallization in a mechanically alloyed Fe-base oxide-dispersion-strengthened alloy
No full textClosure-affected fatigue crack propagation behaviors of powder metallurgy-processed Al-Li alloys in various environments
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Microstructural changes in a mechanically alloyed Al-6.2Zn-2.5Mg-1.7Cu alloy (7010) with and without particulate SiC reinforcement
No full textThe chemical and mechanical processes of thermal fatigue degradation of an aluminide coating
No full textThe chemical and mechanical processes of thermal fatigue degradation of an aluminide coating
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