Light emission as a solar cell analysis technique

In order to determine if a solar cell would indeed emit usable light as expected, a gallium arsenide solar cell was forward biased and examined with an infrared viewer. The light emitted from the solar cell was not uniform, ever though the I-V curve of the solar cell displayed no defects

Improved defect analysis of Gallium Arsenide solar cells using image enhancement

A new technique has been developed to capture, digitize, and enhance the image of light emission from a forward biased direct bandgap solar cell. Since the forward biased light emission from a direct bandgap solar cell has been shown to display both qualitative and quantitative information about the solar cell's performance and its defects, signal processing techniques can be applied to the light emission images to identify and analyze shunt diodes. Shunt diodes are of particular importance because they have been found to be the type of defect which is likely to cause failure in a GaAs solar cell. The presence of a shunt diode can be detected from the light emission by using a photodetector to measure the quantity of light emitted at various current densities. However, to analyze how the shunt diodes affect the quality of the solar cell the pattern of the light emission must be studied. With the use of image enhancement routines, the light emission can be studied at low light emission levels where shunt diode effects are dominant

GROND - a 7-channel imager

We describe the construction of GROND, a 7-channel imager, primarily designed for rapid observations of gamma-ray burst afterglows. It allows simultaneous imaging in the Sloan g'r'i'z' and near-infrared $JHK$ bands. GROND was commissioned at the MPI/ESO 2.2m telescope at La Silla (Chile) in April 2007, and first results of its performance and calibration are presented.Comment: 25 pages, 21 figs, PASP (subm); version with full-resolution figures at http://www.mpe.mpg.de/~jcg/GROND/grond_pasp.pd

Kompakte Lampenvorschaltgeraete mit erweiterbarem Einsatzbereich Technischer Ergebnisbericht

Available from TIB Hannover: F04B1789 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEBundesministerium fuer Bildung und Forschung (BMBF), Bonn (Germany)DEGerman