A contamination-free electron-transparent metallic sample preparation method for MEMS experiments with in situ S/TEM

Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron-microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron-microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.Comment: Preprint submitted to Microscopy and Microanalysi

Resonance ionization of sputtered atoms-progress toward a quantitative technique

The combination of RIMS and ion sputtering has been heralded as the ideal means of quantitatively probing the surface of a solid. While several laboratories have demonstrated the extreme sensitivity of combining RIMS with sputtering, less effort has been devoted to the question of accuracy. Using the SARISA instrument developed at Argonne National Laboratory, a number of well-characterized metallic samples have been analyzed. Results from these determinations have been compared with data obtained by several other analytical methods. One significant finding is that impurity measurements down to ppb levels in metal matrices can be made quantitative by employing polycrystalline metal foils as calibration standards. This discovery substantially reduces the effort required for quantitative analysis since a single standard can be used for determining concentrations spanning nine orders of magnitude

Interview with Prof. M. Grasserbauer.

Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel

Institute for Reference Materials and Measurements Annual Report 1999.

Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel

Metrological Support of IRMM to Clinical Chemistry.

Abstract not availableJRC.D-Institute for Reference Materials and Measurements (Geel