62 research outputs found
High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III–V semiconductor nanostructures and heterostructures
Strategies for preventing group B streptococcal infections in newborns: A nation-wide survey of Italian policies
Managing Burstiness and Scalability in Event-Driven Models on the SpiNNaker Neuromimetic System
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