Characterization of the glass transition in vitreous silica by temperature scanning small-angle X-ray scattering

The temperature dependence of the x-ray scattering in the region below the first sharp diffraction peak was measured for silica glasses with low and high OH content (GE-124 and Corning 7980). Data were obtained upon scanning the temperature at 10, 40 and 80 K/min between 400 K and 1820 K. The measurements resolve, for the first time, the hysteresis between heating and cooling through the glass transition for silica glass, and the data have a better signal to noise ratio than previous light scattering and differential thermal analysis data. For the glass with the higher hydroxyl concentration the glass transition is broader and at a lower temperature. Fits of the data to the Adam-Gibbs-Fulcher equation provide updated kinetic parameters for this very strong glass. The temperature derivative of the observed X-ray scattering matches that of light scattering to within 14%.Comment: EurophysicsLetters, in pres

Deactivation of Pressure-Induced Amorphization in Silicalite SiO2 by Insertion of Guest Species

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Flexibility windows and compression of monoclinic and orthorhombic silicalites

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Organisation structurale locale dans des composes CdS_xSe_1_-_x massifs ou inclus dans une matrice vitreuse

SIGLEAvailable from INIST (FR), Document Supply Service, under shelf-number : T 79935 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc

diffusion aux petits angles des RX et des neutrons

National audienc

Diffusion aux petits angles des Rayons X et des neutrons

National audienc