EUDAQ - A data acquisition software framework for common beam telescopes

EUDAQ is a generic data acquisition software developed for use in conjunction with common beam telescopes at charged particle beam lines. Providing high-precision reference tracks for performance studies of new sensors, beam telescopes are essential for the research and development towards future detectors for high-energy physics. As beam time is a highly limited resource, EUDAQ has been designed with reliability and ease-of-use in mind. It enables flexible integration of different independent devices under test via their specific data acquisition systems into a top-level framework. EUDAQ controls all components globally, handles the data flow centrally and synchronises and records the data streams. Over the past decade, EUDAQ has been deployed as part of a wide range of successful test beam campaigns and detector development applications

Belle II Vertex Detector Performance

The Belle II experiment at the SuperKEKB accelerator (KEK, Tsukuba, Japan) collected its first e+e− collision data in the spring 2019. The aim of accumulating a 50 times larger data sample than Belle at KEKB, a first generation B-Factory, presents substantial challenges to both the collider and the detector, requiring not only state-of-the-art hardware, but also modern software algorithms for tracking and alignment. The broad physics program requires excellent performance of the vertex detector, which is composed of two layers of DEPFET pixels and four layers of double sided-strip sensors. In this contribution, an overview of the vertex detector of Belle II and our methods to ensure its optimal performance, are described, and the first results and experiences from the first physics run are presented

DEPFET pixel detector in the Belle II experiment

The Belle II experiment will run with a reduced beam asymmetry and a factor of 40 higher instantaneous luminosity compared to the Belle experiment. To cope with this and to be able to perform high precision vertex measurements for charge conjugation parity violating processes, a pixel detector based on DEPFET technology will be installed in the center of Belle II. Its basic properties and the DAQ chain are presented in this article

Belle II pixel detector: Performance of final DEPFET modules

A DEpleted P-channel Field Effect Transistor (DEPFET) based pixel detector was developed for the Belle II VerteX Detector (VXD). It is designed to achieve a good impact parameter resolution better than 15μm at the very high luminosity conditions of this experiment. In the first half of 2018 four final production modules have been deployed in the commissioning run of the detector and their performance is discussed

Operational Experience and Performance of the Belle II Pixel Detector

The Belle II experiment at the super KEK B factory (SuperKEKB) started its physics operation with the full detector setup in March 2019, and it aims at collecting 50 ab$^{−1}$ of $e^+e^−$ collision data. The vertex detector (VXD) of Belle II contains a 4-layer silicon vertex detector (SVD) using double sided silicon strips and an inner 2-layer pixel detector (PXD) that is based on the depleted P-channel Field Effect Transistor (DEPFET) technology. The signal generation and amplification are combined in pixels with a minimum pitch of 55 × 50 µm$^2$. The sensors are thinned down to 75 µm, and each module has interconnects and ASICs integrated on the sensor with silicon frames for mechanical support. This approach led to a material budget of around 0.21% X$_0$ per layer including the cooling structure in the acceptance region. The PXD has an integration time of around 20 µs, a signal-to-noise ratio of around 50 and a detecting efficiency of better than 99%. Its two layers are arranged at the radii of 14 and 22 mm around the interaction point, and an impact parameter resolution of better than 15 µm has been achieved. Due to its close proximity to the beam line and its sensitivity to few-keV photons, the PXD also plays an important role in background studies