Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss

Correlation of dynamic parameter modification ans ASET Sensitivity in a shunt voltage reference

International audienc

Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference

International audienc