Advanced Exploration Technologies: Micro and Nano Technologies Enabling Space Missions in the 21st Century

Some of the many new and advanced exploration technologies which will enable space missions in the 21st century and specifically the Manned Mars Mission are explored in this presentation. Some of these are the system on a chip, the Computed-Tomography imaging Spectrometer, the digital camera on a chip, and other Micro Electro Mechanical Systems (MEMS) technology for space. Some of these MEMS are the silicon micromachined microgyroscope, a subliming solid micro-thruster, a micro-ion thruster, a silicon seismometer, a dewpoint microhygrometer, a micro laser doppler anemometer, and tunable diode laser (TDL) sensors. The advanced technology insertion is critical for NASA to decrease mass, volume, power and mission costs, and increase functionality, science potential and robustness

Extrinsic germanium Blocked Impurity Bank (BIB) detectors

Ge:Ga blocked-impurity-band (BIB) detectors with long wavelength thresholds greater than 190 microns and peak quantum efficiencies of 4 percent, at an operating temperature of 1.8 K, have been fabricated. These proof of concept devices consist of a high purity germanium blocking layer epitaxially grown on a Ga-doped Ge substrate. This demonstration of BIB behavior in germanium enables the development of far infrared detector arrays similar to the current silicon-based devices. Present efforts are focussed on improving the chemical vapor deposition process used to create the blocking layer and on the lithographic processing required to produce monolithic detector arrays in germanium. Approaches to test the impurity levels in both the blocking and active layers are considered

Monolithic in-based III-V compound semiconductor focal plane array cell with single stage CCD output

A monolithic semiconductor imager includes an indium-based III-V compound semiconductor monolithic active layer of a first conductivity type, an array of plural focal plane cells on the active layer, each of the focal plane cells including a photogate over a top surface of the active layer, a readout circuit dedicated to the focal plane cell including plural transistors formed monolithically with the monolithic active layer and a single-stage charge coupled device formed monolithically with the active layer between the photogate and the readout circuit for transferring photo-generated charge accumulated beneath the photogate during an integration period to the readout circuit. The photogate includes thin epitaxial semiconductor layer of a second conductivity type overlying the active layer and an aperture electrode overlying a peripheral portion of the thin epitaxial semiconductor layer, the aperture electrode being connectable to a photogate bias voltage

Detecting thermal discrepancies in vessel walls

An infrared, heat-sensing catheter particularly useful for identifying potentially fatal arterial plaques in patients with disease of the coronary or other arteries and its use are detailed. In one embodiment, an infrared fiberoptic system (with or without ultrasound) is employed at the tip of the catheter to locate inflamed, heat-producing, atherosclerotic plaque, which is at greater risk for rupture, fissure, or ulceration, and consequent thrombosis and occlusion of the artery. In another embodiment, a catheter with an infrared detector (with or without ultrasound) employed at its tip will likewise locate inflamed heat-producing atherosclerotic plaque. The devices and methods of the invention may be used to detect abscesses, infection, and cancerous regions by the heat such regions differentially display over the ambient temperature of immediately adjacent tissues. The methods and devices of the invention may also be used to detect regions of cooler than ambient tissue in a vessel or organ which indicate cell death, thrombosis, cell death, hemorrhage, calcium or cholesterol accumulations, or foreign materials

Pluto Integrated Camera-Spectrometer (PICS): A Low Mass, Low Power Instrument for Planetary Exploration

The concept we describe is an integrated instrument (a Pluto Integrated Camera Spectrometer, PICS) that will perform the functions of all three optical instruments required by the Pluto Fast Flyby Mission: the near-IR spectrometer, the camera, and the UV spectrometer. This integrated approach minimizes mass and power use. It also forced us early in the conceptual design to consider integrated observational sequences and integrated power management, thus ensuring compatible duty cycles (i.e. exposure times, readout rates) to meet the composite requirements for data collection, compression, and storage. Based on flight mission experience we believe that this integrated approach will result in substantial cost savings, both in reworking instrument designs during accommodation, as well as in sequence planning and integration. Finally, this integrated payload automatically yields a cohesive mission data set, optimized for correlative analysis. In our baseline concept, a single set of lightweight, multi-wavelength foreoptics is shared by an UV imaging spectrometer (160 spectral channels 10-150 nm), a two-CCD visible imaging system (simultaneously shuttered in two colors 300-500 nm and 500-1000 nm), and a near-IR imaging spectrometer (256 spectral channels 1300-2600 nm), The entire structure and optics is built from SiC, and includes an integrated radiator for thermal control. The design has no moving parts and each spectrometer covers a single octave in wavelength. For the Pluto mission, a separate port (aligned in a direction compatible with the radio occultation experiment) is provided for PICS measurement of a UV solar occultation and for spectral radiance calibration of the IR and visible subsystems. The integrated science this instrument will yield meets or exceeds all of the Priority-1A science objectives and captures many Priority-1B science objectives as well. The presentation will provide details of the PICS instrument design and describe the fabrication and testing of the integrated SiC structure and optics at SSG Inc. Final integration and test plans for the prototype will also be described

Brillouin scattering from opaque semiconducting alloys and thin films

Brillouin scattering spectra were measured in MBE grown single crystal films of A1xGal_xAs alloys and AlxGal_xAs -GaAs supedattices on GaAs substrates, and GaAs films grown on miscut Si substrates. To detect the Brillouin shifted light against the strong elastic background present in opaque materials, a tandem multipass Fabry-Perot system was designed and constructed, providing high resolution and contrast. Scattering from both surface and bulk acoustic waves were used to derive information on the elastic and dielectric constants of AlxGal_xAs alloys. The surface acoustic wave velocities along the [100] and [110] axes were measured for a number of aluminum concentrations. In samples that were transparent to the exciting laser frequency, a leaky surface longitudinal wave was also observed. By fitting to this data, the elastic constants as a function of alloy concentration were found to be Cll = 11.88 + 0.05x, C12 = 5.38 + 1.6x, and CM = 5.95 -.8x (xlOlO dyn/cm2). Scattering from bulk acoustic waves was used to measure the complex index of refraction. The results agree very closely with previous ellipsometric data. Spectra were taken on two superlattices and compared to an alloy of the same average aluminum concentration. No differences were seen in the acoustic velocities or the index of refraction. Brillouin spectra taken of GaAs films on Si exhibited peaks due to acoustic waves trapped in the film. The dispersion curves of these modes as a function of wavevector were fitted by using the bulk elastic constants of GaAs and Si. The good fit obtained, and the narrowness of the peaks, are corroborating evidence of the high crystalline quality of these films.U of I OnlyThesi

Development of In Situ Instruments for Planetary Exploration - Unique Challenges in Design, Development, and Execution

A viewgraph presentation describing in situ instruments for NASA missions is shown. The topics include: 1) In Situ Instrumentation; 2) Planetary Extremes; 3) Mars Surface Environment; 4) Lunar Precursor Mission Environment; 5) Europa Surface Analogue; 6) Other Parameters; 7) Space In Situ Instrumentation still in its Infancy; 8) Needed Capabilities For In Situ Science; 9) Framework For Putting The Pieces Together; 10) The Wild World of Astrobiology; 11) Timeline; 12) Example: MOD; 13) In Situ Sample Analysis Laboratories are more complex; 14) technologies In Situ Sample Analysis Requires Integration of Many Emerging Advanced Concepts; 15) Supporting technologies for In Situ Laboratories; 16) Micro-laboratory example; 17) In Situ Instrument Classes; and 18) Key for Analytical Instrument:Sample Preparation