20 research outputs found

    Nano-pathways: Bridging the divide between water-processable nanoparticulate and bulk heterojunction organic photovoltaics

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    Here we report the application of a conjugated copolymer based on thiophene and quinoxaline units, namely poly[2,3-bis-(3-octyloxyphenyl)quinoxaline-5,8-diyl-alt-thiophene-2,5-diyl] (TQ1), to nanoparticle organic photovoltaics (NP-OPVs). TQ1 exhibits more desirable material properties for NP-OPV fabrication and operation, particularly a high glass transition temperature (Tg) and amorphous nature, compared to the commonly applied semicrystalline polymer poly(3-hexylthiophene) (P3HT). This study reports the optimisation of TQ1:PC71BM (phenyl C71 butyric acid methyl ester) NP-OPV device performance by the application of mild thermal annealing treatments in the range of the Tg (sub-Tg and post-Tg), both in the active layer drying stage and post-cathode deposition annealing stage of device fabrication, and an in-depth study of the effect of these treatments on nanoparticle film morphology. In addition, we report a type of morphological evolution in nanoparticle films for OPV active layers that has not previously been observed, that of PC71BM nano-pathway formation between dispersed PC71BM-rich nanoparticle cores, which have the benefit of making the bulk film more conducive to charge percolation and extraction

    Scanning transmission X-ray microscopy at a bending magnet beamline at the Advanced Light Source

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    During the last two decades, scanning transmission x-ray microscopy (STXM) has evolved into a powerful characterization tool. For best performance, STXM's are located at undulator sources at synchrotron facilities. The scarcity and expense of undulator sourccs and associated beamlines limits the number of availahle STXMs. We have successfully re-examined the use of bending magnets as a source for a STXM and implemented a interferorneter controlled STXM with excellent performance at the beamline 5.3.2. at the Advanced Light Source. Near the carbon K-edge, periodic features with 30 nm half-period could be resolvcd with a zonc plaie that has a 40 nrn outermost zone width with an energy resolution corresponding to 100 meV and an intensity of about 1 MHz. The design and performance of the microscope are described

    Microanalytical methods for in situ high resolution analysis of rock varnish at the micrometer to nanometer scale

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    A wide range of analytical techniques were used to investigate rock varnish from different locations (Negev, Israel; Knersvlakte, South Africa; Death Valley and Mojave Desert, California): a 200 nm-femtosecond laser ablation-inductively coupled plasma-mass spectrometer (LA-ICP-MS), an electron probe microanalyzer (EPMA), focused ion beam (FIB) slicing, and scanning transmission X-ray microscopy-near edge X-ray absorption fine structure spectroscopy (STXM-NEXAFS). This combination enables comprehensive high-spatial-resolution analysis of rock varnish. Femtosecond LA-ICP-MS and EPMA were used for quantitative determination of element concentrations. In-situ measurements were conducted on thick and thin sections with a resolution of 10-40 mu m and 2 mu m, respectively. The results demonstrate that some elements, such as Mn, Co, Pb, Ni, and Cu, are highly enriched in varnish relative to the upper continental crust (up to a factor of 100). The varnish composition is not influenced by the composition of the underlying rock, which is witnessed by plots of MnO2 vs. SiO2 contents. Furthermore, the Mn-free end members fall in the range of average dust compositions. The varnishes from the various locations show distinct differences in some elemental ratios, in particular Mn/Fe (0.3-25.1), Mn/Ba (4-170), Ni/Co (0.03-1.8) and Pb/Ni (0.4-23). The rare earth element (REE) patterns vary with La-N/Yb-N = 3.5-12 and different degrees of Ce anomalies (Ce/Ce* = 1.5-5.3). To study the internal structure of the varnish, 100-200 nm thick FIB slices were prepared and mappings of Fe, Mn, N, CO32-, Ca, C, and Si at the nm scale performed. Banded internal structures of Mn, Fe and organic C were observed in the Israeli and Californian samples, however, no Fe-rich layers are present in the South African rock varnish samples. Furthermore, cavities were found that are partly filled by C, Fe, and Mn rich material. Internal structures are different for varnish from different locations, which might reflect different types of genesis. The results of the combined microanalytical techniques give important detailed insights towards unraveling the genesis of rock varnish. (C) 2015 Elsevier B.V. All rights reserved
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