Effect of a Physical Phase Plate on Contrast Transfer in an Aberration-Corrected Transmission Electron Microscope

In this theoretical study we analyze contrast transfer of weak-phase objects in a transmission electron microscope, which is equipped with an aberration corrector (Cs-corrector) in the imaging lens system and a physical phase plate in the back focal plane of the objective lens. For a phase shift of pi/2 between scattered and unscattered electrons induced by a physical phase plate, the sine-type phase contrast transfer function is converted into a cosine-type function. Optimal imaging conditions could theoretically be achieved if the phase shifts caused by the objective lens defocus and lens aberrations would be equal zero. In reality this situation is difficult to realize because of residual aberrations and varying, non-zero local defocus values, which in general result from an uneven sample surface topography. We explore the conditions - i.e. range of Cs-values and defocus - for most favourable contrast transfer as a function of the information limit, which is only limited by the effect of partial coherence of the electron wave in Cs-corrected transmission electron microscopes. Under high-resolution operation conditions we find that a physical phase plate improves strongly low- and medium-resolution object contrast, while improving tolerance to defocus and Cs-variations, compared to a microscope without a phase plate

Carbon

The microstructure of carbon/carbon composites obtained by isothermal. isobaric chemical vapor infiltration (CVI) of carbon fiber preforms consisting of aligned fiber bundles separated by fiber fleeces was studied comparatively by polarized light microscopy (PLM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) combined with selected area electron diffraction (SAED). Deposition rate as well as matrix microstructure do not differ in the aligned fiber bundles and fiber fleeces exhibiting different local surface area/volume ratios. The matrices which are homogeneously textured according to PLM exhibit pronounced spatial texture gradients at the sub-mu m-scale if investigated by SAED, The texture gradients appear to be independent on the infiltration time, distance between fibers but evidently depend on the total methane pressure. TEM and SEM observations show a thin high-textured layer between the fiber and the medium-textured transitional layer below the high-textured matrix layer containing columnar grains. This thin layer replicates the surface unevenness of the fiber surface while it is absent at the initial carbon fiber surface before infiltration. (C) 2005 Elsevier Ltd. All rights reserved.The microstructure of carbon/carbon composites obtained by isothermal. isobaric chemical vapor infiltration (CVI) of carbon fiber preforms consisting of aligned fiber bundles separated by fiber fleeces was studied comparatively by polarized light microscopy (PLM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) combined with selected area electron diffraction (SAED). Deposition rate as well as matrix microstructure do not differ in the aligned fiber bundles and fiber fleeces exhibiting different local surface area/volume ratios. The matrices which are homogeneously textured according to PLM exhibit pronounced spatial texture gradients at the sub-mu m-scale if investigated by SAED, The texture gradients appear to be independent on the infiltration time, distance between fibers but evidently depend on the total methane pressure. TEM and SEM observations show a thin high-textured layer between the fiber and the medium-textured transitional layer below the high-textured matrix layer containing columnar grains. This thin layer replicates the surface unevenness of the fiber surface while it is absent at the initial carbon fiber surface before infiltration. (C) 2005 Elsevier Ltd. All rights reserved

Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plate

Imaging of weak amplitude and phase objects, such as unstained vitrified biological samples, by conventional transmission electron microscopy (TEM) suffers from poor object contrast since the amplitude and phase of the scattered electron wave change only very little. In phase contrast light microscopy the imaging of weak phase objects is greatly enhanced by the use of a quarter-wave phase plate, which produces high signal contrast by shifting the phase of the scattered light. An analogous quarter-wave plate for the electron microscope, designed as an electrostatic einzel lens, was proposed by Boersch in 1947 but the small dimensions of the device have impeded its realization up to now. We here present the first fabrication and application of a miniaturized electrostatic einzel lens driven as TEM quarter-wave phase plate. Phase modulation is generated by the electrostatic field confined to the inside of a microstructured ring electrode. This field affects the phase velocity of the unscattered part of the electron wave. By varying its strength the phase shift of the primary beam can be adjusted to alpha/2, producing strong phase contrast independent of spatial frequency. The phase plate proves to be mechanically stable and does not impair image quality, in particular it does not reduce the high-resolution signal. The expected residual lens effect of the einzel lens is minimal. Our microlens is supported by conducting rods arranged in a threefold symmetry. This particular geometry provides optimized single-sideband signal transfer for spatial frequencies otherwise obstructed by the supporting rods