TET-GAN: Text Effects Transfer via Stylization and Destylization

Text effects transfer technology automatically makes the text dramatically more impressive. However, previous style transfer methods either study the model for general style, which cannot handle the highly-structured text effects along the glyph, or require manual design of subtle matching criteria for text effects. In this paper, we focus on the use of the powerful representation abilities of deep neural features for text effects transfer. For this purpose, we propose a novel Texture Effects Transfer GAN (TET-GAN), which consists of a stylization subnetwork and a destylization subnetwork. The key idea is to train our network to accomplish both the objective of style transfer and style removal, so that it can learn to disentangle and recombine the content and style features of text effects images. To support the training of our network, we propose a new text effects dataset with as much as 64 professionally designed styles on 837 characters. We show that the disentangled feature representations enable us to transfer or remove all these styles on arbitrary glyphs using one network. Furthermore, the flexible network design empowers TET-GAN to efficiently extend to a new text style via one-shot learning where only one example is required. We demonstrate the superiority of the proposed method in generating high-quality stylized text over the state-of-the-art methods.Comment: Accepted by AAAI 2019. Code and dataset will be available at http://www.icst.pku.edu.cn/struct/Projects/TETGAN.htm

A linear method to extract diode model parameters of solar panels from a single I–V curve

The I-V characteristic curve is very important for solar cells/modules being a direct indicator of performance. But the reverse derivation of the diode model parameters from the I-V curve is a big challenge due to the strong nonlinear relationship between the model parameters. It seems impossible to solve such a nonlinear problem accurately using linear identification methods, which is proved wrong in this paper. By changing the viewpoint from conventional static curve fitting to dynamic system identification, the integral-based linear least square identification method is proposed to extract all diode model parameters simultaneously from a single I-V curve. No iterative searching or approximation is required in the proposed method. Examples illustrating the accuracy and effectiveness of the proposed method, as compared to the existing approaches, are presented in this paper. The possibility of real-time monitoring of model parameters versus environmental factors (irradiance and/or temperatures) is also discussed