RF and IF mixer optimum matching impedances extracted by large-signal vectorial measurements

This paper introduces a new technique that allows us to measure the admittance conversion matrix of a two-port device,using a Nonlinear Vector Network Analyzer.This method is applied to extract the conversion matrix of a 0.2 µµµµm pHEMT,driven by a 4.8 GHz pump signal,at different power levels,using an intermediate frequency of 600 MHz.The issue on data inconsistency due to phase randomization among different measurements is discussed and a proper pre- processing algorithm is proposed to fix the problem. The output of this work consists of a comprehensive experimental evaluation of up-and down-conversion maximum gain,stability,and optimal RF and IF impedances

Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors

We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National Institute of Standards and Technology (NIST) Microwave Uncertainty Framework. We include in our analysis uncertainties in the passive calibration standards, power meter, NIST-traceable phase calibration reference, cable bending, and probe alignment. These uncertainties are propagated first to the electrical quantities across the terminals of the device-under-test, which was an on-wafer microwave transistor. Next, we propagate uncertainties to the transistor current-generator plane, whose temporal voltage/current waveforms and impedances are of interest for the design of power amplifiers