22 research outputs found

    Optical extinction in a single layer of nanorods

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    We demonstrate that almost 100 % of incident photons can interact with a monolayer of scatterers in a symmetrical environment. Nearly-perfect optical extinction through free-standing transparent nanorod arrays has been measured. The sharp spectral opacity window, in the form of a characteristic Fano resonance, arises from the coherent multiple scattering in the array. In addition, we show that nanorods made of absorbing material exhibit a 25-fold absorption enhancement per unit volume compared to unstructured thin film. These results open new perspectives for light management in high-Q, low volume dielectric nanostructures, with potential applications in optical systems, spectroscopy, and optomechanics

    Cu(In,Ga)Se 2 mesa microdiodes: study of edge recombination and behaviour under concentrated sunlight

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    ABSTRACT In order to develop photovoltaic devices with increased efficiency using less rare semiconductor materials, the concentrating approach is applied on Cu(In,Ga)Se2 thin film devices. For this purpose, Cu(In,Ga)Se2 microcells with a mesa design are fabricated. The influence of the edge recombination signal is analyzed. It is found that with an appropriate etching procedure, devices as small as 50x50 ”m do not experience edge recombination efficiency limitations. Under concentration, significant Voc gains are seen, leading to an absolute efficiency increase of two points per decade

    Compact planar lenses based on a pinhole and an array of single mode metallic slits

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    Plasmonic lenses are based on complex combinations of nanoscale high aspect ratio slits. We show that their design can be greatly simplified, keeping similar performance while releasing technological constraints. The simplified system, called Huygens lens, consists in a central aperture surrounded by several identical single mode slits in a thin gold layer that does not rely anymore on surface plasmons. The focusing behaviour with respect to the position and number of slits is investigated, and we demonstrate the interest of this design to get compact array of lenses

    Strong Discontinuities in the Complex Photonic Band Structure of Transmission Metallic Gratings

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    Complex photonic band structures (CPBS) of transmission metallic gratings with rectangular slits are shown to exhibit strong discontinuities that are not evidenced in the usual energetic band structures. These discontinuities are located on Wood's anomalies and reveal unambiguously two different types of resonances, which are identified as horizontal and vertical surface-plasmon resonances. Spectral position and width of peaks in the transmission spectrum can be directly extracted from CPBS for both kinds of resonances.Comment: 4 pages, 4 figures, REVTeX version

    Efficient light absorption in metal-semiconductor-metal nanostructures

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    International audienceA nanoscale metal-semiconductor grating is proposed for efficient and ultrafast photodetection. Theoretical and experimental results of efficient absorption in nanoscopic semiconductor wires are presented. The strong confinement of light in subwavelength metal-semiconductor gratings is achieved by Fabry-PĂ©rot resonances involving vertical transverse magnetic surface-plasmon waves and transverse electric guided waves. Photodetectors have been fabricated with 40×100 nm cross sections of Ag and GaAs wires. The reflectivity and photocurrent mesurements are in good agreement with theoretical estimates

    Horizontal and vertical surface resonances in transmission metallic gratings

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    International audienceIn transmission metallic gratings, quasi-total transmission of light is achieved by two different mechanisms, which are the excitation of horizontal and vertical surface-plasmon resonances. Both resonances are represented on complex photonic band structures for a wide range of grating thicknesses. The evolution of the electromagnetic field intensity provides a physical understanding of the behaviour of dispersion curves and of lifetime discontinuities in Wood-Rayleigh anomalies in particular. Both radiative and non-radiative processes are distinguished in the resonances' width, giving limits for the use of metallic gratings in photonic devices

    Experimental study of hot electron inelastic scattering rate in p-type InGaAs

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    International audienceThe inelastic scattering rates of electrically injected minority hot electrons measured using a continuous-wave spatially resolved electroluminescence spectroscopy are reported. To our knowledge, this constitutes direct experimental determination of this parameter related to the individual inelastic interactions. The evolution of the electron relaxation rate with increasing majority hole density is explored. Remarkably, an attenuation of the scattering rate is measured for p-doping levels higher than 2×1019 cm-3. Additionally, the measured hot-electron energy distributions further indicate that the relaxation mechanisms are dominated by LO phonon-plasmons coupled modes in the range 1018 to 1019 cm-3 hole density. Finally, the temperature dependence of inelastic scattering rate is also measured to learn on the potential implication of ballistic transport in RT operating hot-electron devices

    XPS chemical state mapping in opto- and microelectronics

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    International audienceDans le but d’approcher des compositions chimiques de surface de quelques millimĂštres carrĂ©s, l’imagerie XPS est un atout indĂ©niable. Ces mesures de photoĂ©mission peuvent s’avĂ©rer utiles pour i) localiser avec confiance des objets micromĂ©triques, ii) connaĂźtre la distribution spatiale des Ă©lĂ©ments constitutifs de la surface (cartographie Ă©lĂ©mentaire) et iii) diffĂ©rencier localement des environnements chimiques.Les diffĂ©rents modes d’acquisition d’images (snap map vs parallel imaging), dĂ©veloppĂ©s grĂące Ă  la diminution des tailles de spot de rayons X (jusqu’à la dizaine de microns) ou l’utilisation conjointe d’une lentille et d’un dĂ©tecteur 2D, ouvrent la porte Ă  la caractĂ©risation de motifs dans une large gamme d'applications industrielles et en particulier dans le domaine de la micro- optoĂ©lectronique. Les dimensions caractĂ©ristiques mises en jeu dans ce type de dispositifs nĂ©cessitent gĂ©nĂ©ralement une analyse sur des zones trop fines pour ĂȘtre caractĂ©risĂ©es avec des outils traditionnels tels que la microscopie Ă©lectronique Ă  balayage couplĂ©e Ă  de la spectroscopie de rayons X Ă  dispersion d'Ă©nergie (MEB-EDS). Par ailleurs, le recours souvent nĂ©cessaire Ă  des couches de passivation isolantes (oxydes, nitrures
) rend l’utilisation de la spectroscopie d’électrons Auger (AES) assez dĂ©licate Ă  mettre en Ɠuvre. Dans ces conditions, malgrĂ© une rĂ©solution latĂ©rale nettement plus faible, l’imagerie XPS avec un canon Ă  neutralisation de charges s’avĂšre ĂȘtre une technique de choix.Dans cette prĂ©sentation, nous montrerons l’intĂ©rĂȘt de la cartographie XPS dans le cadre de la structuration de matĂ©riaux III-V. En effet, il est rapportĂ© que le traitement Ă©lectrochimique anodique du phosphure d’indium (InP) dans NH3 liquide permet la croissance d’une couche ultramince de type polyphosphazĂšne (PPP) en surface du semiconducteur1. L'extrĂȘme stabilitĂ© chimique de ce film d’épaisseur nanomĂ©trique en fait un matĂ©riau propice pour rĂ©aliser des masques pour la gravure humide d’InP2. La structuration du PPP grĂące Ă  des techniques de dĂ©pĂŽt sĂ©lectif, Ă©tape clĂ© dans le procĂ©dĂ© technologique, sera dĂ©montrĂ©e par imagerie XPS des niveaux de cƓur N1s et P2p (Figure 1).Par ailleurs, nous dĂ©taillerons l’apport de la cartographie XPS pour la caractĂ©risation d’hĂ©tĂ©rostructures d’oxydes pĂ©rovskites, classe de matĂ©riaux prometteurs pour l’électronique du futur. L’imagerie XPS des niveaux de cƓur Ti2p et V2p sur l’empilement (SrTiO3/SrVO3) met clairement en Ă©vidence les deux domaines (Figure 2). La cartographie XPS du niveau de cƓur Sr3d sera discutĂ©e : le strontium Ă©tant commun aux deux oxydes et dans des environnements chimiques3,4 trĂšs proches
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