11 research outputs found

    Silicon quantum dots in photovoltaic devices: device fabrication, characterization and comparison of materials

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    The realization of crystalline silicon tandem solar cells relies on silicon nanocrystal (Si NC) quantum dots as the absorber of the top solar cell. Quantum confinement of charge carriers within the nanocrystals permits to achieve a band gap up to 2 eV which can be adjusted according to the size of the nanocrystals. This enables the construction of all-crystalline Si tandem solar cells, and increases the theoretical efficiency limit from 33 % to 42.5 % due to the addition of a second band gap. In this work, the electrical and photovoltaic properties of Si NC films are assessed and the most prominent material systems (SiO2, Si3N4, SiC) are compared. P-i-n solar cells are presented which feature Si NC as the intrinsic absorber layer and permit to characterize quantum confinement electrically on device level. P-i-n solar cells with Si NC in SiC in the i-region have yielded open circuit voltages of up to 370mV

    Observation of muonic Dalitz decays of chib mesons and precise spectroscopy of hidden-beauty states

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    The decays of the χb1(1P), χb2(1P), χb1(2P) and χb2(2P) mesons into the Υ(1S)µ +µ − final state are observed with a high significance using proton-proton collision data collected with the LHCb detector and corresponding to an integrated luminosity of 9 fb−1 . The newly observed decays together with the Υ(2S) → Υ(1S)π +π − and Υ(3S) → Υ(2S)π +π − decay modes are used for precision measurements of the mass and mass splittings for the hidden-beauty states

    Activation of visible up-conversion luminescence in transparent and conducting ZnO:Er:Yb films by laser annealing

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    Transparent and conducting ZnO:Er:Yb thin films with visible up-conversion (660-nm emission under 980-nm excitation) were fabricated by RF magnetron sputtering. The as-deposited films were found to be transparent and conducting and the activation of the Er ions in these films to produce up-conversion luminescence was achieved by different post-deposition annealing treatments in air, vacuum or by laser annealing using a Nd:YVO4 laser. The structural, electrical and optical properties and the up-conversion efficiency of these films were found to be strongly influenced by the annealing method, and a detailed study is reported in this paper. It has been demonstrated that, although the air annealing was the most efficient in terms of up-conversion, laser annealing was the only method capable of activating Er ions while preserving the electrical conductivity of the doped films. It has been shown that a minimum energy was needed in laser annealing to optically activate the rare earth ions in the ZnO host material to produce up-conversion. Up-converting and transparent conducting ZnO:Er:Yb films with an electrical resistivity of 5 x 10(-2) cm and transparency 80% in the visible wavelength range has been achieved by laser annealing. (C) 2015 Elsevier B.V. All rights reserved

    Retrieving the spatial distribution of cavity modes in dielectric resonators by near-field imaging and electrodynamics simulations

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    For good performance of photonic devices whose working principle is based on the enhancement of electromagnetic fields obtained by confining light into dielectric resonators with dimensions in the nanometre length scale, a detailed knowledge of the optical mode structure becomes essential. However, this information is usually lacking and can only be indirectly obtained by conventional spectroscopic techniques. Here we unraveled the influence of wire size, incident wavelength, degree of polarization and the presence of a substrate on the optical near fields generated by cavity modes of individual hexagonal ZnO nanowires by combining scanning near-field optical microscopy (SNOM) with electrodynamics calculations within the discrete dipole approximation (DDA). The near-field patterns obtained with very high spatial resolution, better than 50 nm, exhibit striking size and spatial-dispersion effects, which are well accounted for within DDA, using a wavevector-dependent dipolar interaction and considering the dielectric anisotropy of ZnO. Our results show that both SNOM and DDA simulations are powerful tools for the design of optoelectronic devices able to manipulate light at the nanoscale.Fil: Goñi, Alejandro R.. Consejo Superior de Investigaciones Científicas. Instituto de Ciencia de los Materiales de Barcelona; EspañaFil: Güell, Frank. Universidad de Barcelona; EspañaFil: Pérez, Luis Alberto. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; ArgentinaFil: Lopez-Vidrier, Julian. Universidad de Barcelona; EspañaFil: Ossó, J. Oriol. Universidad de Barcelona; EspañaFil: Coronado, Eduardo A.. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Córdoba. Instituto de Investigaciones en Físico-química de Córdoba. Universidad Nacional de Córdoba. Facultad de Ciencias Químicas. Instituto de Investigaciones en Físico-química de Córdoba; ArgentinaFil: Morante, Joan R.. Universidad de Barcelona; Españ

    Investigation on the structural changes of ZnO:Er:Yb thin film during laser annealing to fabricate a transparent conducting upconverter

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    A transparent and conducting ZnO:Er:Yb thin film with upconversion properties has been achieved after being annealed with continuous laser radiation just before the ablation point of the material. This work demonstrates that the laser energy preserves the conductivity of the film and at the same time creates an adequate surrounding for Er and Yb to produce visible upconversion at 660, 560, 520, and 480 nm under 980 nm laser excitation. The relation between the structural, electrical and upconversion properties is discussed. It is observed that the laser energy melts part of the material, which recrystallizes creating rare earth oxides and two different wurtzite structures, one with substitutional rare earths and oxygen vacancies (responsible for the conductivity) and the other without substitutional rare earth ions (responsible for the upconversion emission). (C) 2017 Elsevier B.V. All rights reserved

    Electrical and optical characterisation of silicon nancrystals embedded in SiC

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    Silicon nanocrystals (Si NCs) are a promising candidate for the top cell of an all-Si tandem solar cell with a band gap from 1.3-1.7 eV, tuneable by adjusting NC size. They are readily produced within a Si-based dielectric matrix by precipitation from the Si excess in multilayers of alternating stoichiometric and silicon-rich layers. Here we examined the luminescence and transport of Si NCs embedded in SiC. We observed luminescence that redshifts from 2.0 to 1.5 eV with increasing nominal NC size. Upon further investigation, we found that this redshift is to a large extent due to Fabry-Pérot interference. Correction for this effect allows an analysis of the spectrum emitted from within the sample. We also produced p-i-n solar cells and found that the observed I-V curves under illumination could be well-fitted by typical thin-film solar cell models including finite series and parallel resistances, and a voltage-dependent current collection function. A minority carrier mobility-lifetime product on the order of 10-10 cm2/V was deduced, and a maximum open-circuit voltage of 370 mV achieved

    Silicon nanocrystals in carbide matrix

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    Ordered silicon nanocrystals in silicon carbide are produced by Plasma Enhanced Chemical Vapor Deposition by means of the multilayer approach followed by annealing at 1100 C. The crystallization is verified by Raman scattering, X-ray diffraction, Transmission Electron Microscopy, and UV\u2013vis spectroscopy. The conditions for the periodic structure to survive the high temperature annealing and for the SiC barrier to confine the Si crystal growth are examined by energy-filtered transmission electron microscopy and X-ray reflection. The final layout appears to be strongly influenced by the structural features of the as-deposited multilayer. Threshold values of Si-rich carbide sublayer thickness and Si-to-C ratio are identified in order to preserve the ordered structure. The crystallized fraction is observed to be correlated with the total silicon volume fraction. The constraints are examined through the use of ab-initio calculations of matrix-embedded silicon nanocrystals, as well as in terms of existing models for nanocrystal formation, in order to establish the role played by the interface energy on nanocrystal outgrowth, residual amorphous fraction, and continuous crystallization. A parameter space of formation of ordered Si nanocrystals is proposed. The diffusivity of carbon in the crystallized material is evaluated, and estimated to be around 10\u201316 cm2/s at 1100 C. \ua9 2014 Elsevier B.V

    Silicon nanocrystals in carbide matrix

    No full text
    Ordered silicon nanocrystals in silicon carbide are produced by Plasma Enhanced Chemical Vapor Deposition by means of the multilayer approach followed by annealing at 1100 C. The crystallization is verified by Raman scattering, X-ray diffraction, Transmission Electron Microscopy, and UV\u2013vis spectroscopy. The conditions for the periodic structure to survive the high temperature annealing and for the SiC barrier to confine the Si crystal growth are examined by energy-filtered transmission electron microscopy and X-ray reflection. The final layout appears to be strongly influenced by the structural features of the as-deposited multilayer. Threshold values of Si-rich carbide sublayer thickness and Si-to-C ratio are identified in order to preserve the ordered structure. The crystallized fraction is observed to be correlated with the total silicon volume fraction. The constraints are examined through the use of ab-initio calculations of matrix-embedded silicon nanocrystals, as well as in terms of existing models for nanocrystal formation, in order to establish the role played by the interface energy on nanocrystal outgrowth, residual amorphous fraction, and continuous crystallization. A parameter space of formation of ordered Si nanocrystals is proposed. The diffusivity of carbon in the crystallized material is evaluated, and estimated to be around 10\u201316 cm2/s at 1100 C

    Silicon quantum dots in photovoltaic devices: device fabrication, characterization and comparison of materials

    Get PDF
    The realization of crystalline silicon tandem solar cells relies on silicon nanocrystal (Si NC) quantum dots as the absorber of the top solar cell. Quantum confinement of charge carriers within the nanocrystals permits to achieve a band gap up to 2 eV which can be adjusted according to the size of the nanocrystals. This enables the construction of all-crystalline Si tandem solar cells, and increases the theoretical efficiency limit from 33 % to 42.5 % due to the addition of a second band gap. In this work, the electrical and photovoltaic properties of Si NC films are assessed and the most prominent material systems (SiO2, Si3N4, SiC) are compared. P-i-n solar cells are presented which feature Si NC as the intrinsic absorber layer and permit to characterize quantum confinement electrically on device level. P-i-n solar cells with Si NC in SiC in the i-region have yielded open circuit voltages of up to 370mV
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