Structure of Quantum Wires in Au/Si(557)

The structure of the Au/Si(557) surface is determined from three-dimensional x-ray diffraction measurements, which directly mandate a single Au atom per unit cell. We use a “heavy atom” method in which the Au atom images the rest of the structure. Au is found to substitute for a row of first-layer Si atoms in the middle of the terrace, which then reconstructs by step rebonding and adatoms. The structure is consistent with the 1D metallic behavior seen by photoemission

Three-dimensional Imaging of Microstructure in Gold Nanocrystals

X-ray diffraction using a coherent beam involves the mutual interference among all the extremities of small crystals. The continuous diffraction pattern so produced can be phased because it can be oversampled. We have thus obtained three-dimensional images of the interiors of Au nanocrystals that show 50 nm wide bands of contrast with f111g orientation that probably arise from internal twinning by dynamic recrystallization during their formation at high temperature

Reconstruction of the Shapes of Gold Nanocrystals using Coherent X-ray Diffraction

Inverse problems arise frequently in physics: The magnitude of the Fourier transform of some function is measurable, but not its phase. The “phase problem” in crystallography arises because the number of discrete measurements (Bragg peak intensities) is only half the number of unknowns (electron density points in space). Sayre first proposed that oversampling of diffraction data should allow a solution, and this has recently been demonstrated. Here we report the successful phasing of an oversampled hard x-ray diffraction pattern measured from a single nanocrystal of gold

Probe-diverse ptythography

We propose an extension of ptychography where the target sample is scanned separately through several probes with distinct amplitude and phase profiles and a diffraction image is recorded for each probe and each sample translation. The resulting probe-diverse dataset is used to iteratively retrieve high-resolution images of the sample and all probes simultaneously. The method is shown to yield significant improvement in the reconstructed sample image compared to the image obtained using the standard single-probe ptychographic phase-retrieval scheme

3D X-Ray Nanotomography of Cells Grown on Electrospun Scaffolds

Here, it is demonstrated that X-ray nanotomography with Zernike phase contrast can be used for 3D imaging of cells grown on electrospun polymer scaffolds. The scaffold fibers and cells are simultaneously imaged, enabling the influence of scaffold architecture on cell location and morphology to be studied. The high resolution enables subcellular details to be revealed. The X-ray imaging conditions were optimized to reduce scan times, making it feasible to scan multiple regions of interest in relatively large samples. An image processing procedure is presented which enables scaffold characteristics and cell location to be quantified. The procedure is demonstrated by comparing the ingrowth of cells after culture for 3 and 6 days

Virtual edge illumination and one dimensional beam tracking for absorption, refraction, and scattering retrieval

We propose two different approaches to retrieve x-ray absorption, refraction, and scattering signals using a one dimensional scan and a high resolution detector. The first method can be easily implemented in existing procedures developed for edge illumination to retrieve absorption and refraction signals, giving comparable image quality while reducing exposure time and delivered dose. The second method tracks the variations of the beam intensity profile on the detector through a multi-Gaussian interpolation, allowing the additional retrieval of the scattering signal

X-ray ptychography on low-dimensional hard-condensed matter materials

Tailoring structural, chemical, and electronic (dis-)order in heterogeneous media is one of the transformative opportunities to enable new functionalities and sciences in energy and quantum materials. This endeavor requires elemental, chemical, and magnetic sensitivities at the nano/atomic scale in two- and three-dimensional space. Soft X-ray radiation and hard X-ray radiation provided by synchrotron facilities have emerged as standard characterization probes owing to their inherent element-specificity and high intensity. One of the most promising methods in view of sensitivity and spatial resolution is coherent diffraction imaging, namely, X-ray ptychography, which is envisioned to take on the dominance of electron imaging techniques offering with atomic resolution in the age of diffraction limited light sources. In this review, we discuss the current research examples of far-field diffraction-based X-ray ptychography on two-dimensional and three-dimensional semiconductors, ferroelectrics, and ferromagnets and their blooming future as a mainstream tool for materials sciences

Multi-slice ptychography with large numerical aperture multilayer Laue lenses

The highly convergent x-ray beam focused by multilayer Laue lenses with large numerical apertures is used as a three-dimensional (3D) probe to image layered structures with an axial separation larger than the depth of focus. Instead of collecting weakly scattered high-spatial-frequency signals, the depth-resolving power is provided purely by the intense central cone diverged from the focused beam. Using the multi-slice ptychography method combined with the on-the-fly scan scheme, two layers of nanoparticles separated by 10 μm are successfully reconstructed with 8.1 nm lateral resolution and with a dwell time as low as 0.05 s per scan point. This approach obtains high-resolution images with extended depth of field, which paves the way for multi-slice ptychography as a high throughput technique for high-resolution 3D imaging of thick samples

Beyond crystallography: diffractive imaging using coherent x-ray light sources

X-ray crystallography has been central to the development of many fields of science over the past century. It has now matured to a point that as long as good-quality crystals are available, their atomic structure can be routinely determined in three dimensions. However, many samples in physics, chemistry, materials science, nanoscience, geology, and biology are noncrystalline, and thus their three-dimensional structures are not accessible by traditional x-ray crystallography. Overcoming this hurdle has required the development of new coherent imaging methods to harness new coherent x-ray light sources. Here we review the revolutionary advances that are transforming x-ray sources and imaging in the 21st century