4 research outputs found
Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
In this work recently produced and commercially available glazed ceramic
object with metallic lustre decoration was studied by using a spectroscopic
ellipsometer with rotating compensator. The thickness and metal content of the
surface lustre layers are determined by ion beam analytical techniques, i.e.,
Rutherford backscattering spectrometry and external beam particle-induced X-ray
emission and the results were utilized in the construction of multilayer
optical models for the evaluation and interpretation of the
spectroellipsometric measurements.Comment: in press, Thin Solid Film