2 research outputs found
CO<sub>2</sub> Enhanced Chemical Vapor Deposition Growth of Few-Layer Graphene over NiO<sub><i>x</i></sub>
The use of mild oxidants in chemical vapor deposition (CVD) reactions has proven enormously useful. This was also true for the CVD growth of carbon nanotubes. As yet though, the use of mild oxidants in the CVD of graphene has remained unexplored. Here we explore the use of CO<sub>2</sub> as a mild oxidant during the growth of graphene over Ni with CH<sub>4</sub> as the feedstock. Both our experimental and theoretical findings provide in-depth insight into the growth mechanisms and point to the mild oxidants playing multiple roles. Mild oxidants lead to the formation of a suboxide in the Ni, which suppresses the bulk diffusion of C species suggesting a surface growth mechanism. Moreover, the formation of a suboxide leads to enhanced catalytic activity at the substrate surface, which allows reduced synthesis temperatures, even as low as 700 °C. Even at these low temperatures, the quality of the graphene is exceedingly high as indicated by a negligible D mode in the Raman spectra. These findings suggest the use of mild oxidants in the CVD fabrication as a whole could have a positive impact
Graphene for True Ohmic Contact at Metal–Semiconductor Junctions
The rectifying Schottky characteristics
of the metal–semiconductor
junction with high contact resistance have been a serious issue in
modern electronic devices. Herein, we demonstrated the conversion
of the Schottky nature of the Ni–Si junction, one of the most
commonly used metal–semiconductor junctions, into an Ohmic
contact with low contact resistance by inserting a single layer of
graphene. The contact resistance achieved from the junction incorporating
graphene was about 10<sup>–8</sup> ∼ 10<sup>–9</sup> Ω cm<sup>2</sup> at a Si doping concentration of 10<sup>17</sup> cm<sup>–3</sup>