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    High Accuracy In-Flight Wavelength Calibration of Imaging Spectrometry Data

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    Accurate wavelength calibration of imaging spectrometer data is essential if proper atmospheric transmission corrections are to be made to obtain apparent surface reflectance. Accuracies of 0.1 nm are necessary for a 10 nm-sampling instrument in order to match the slopes of the deep atmospheric water vapor features that dominate the 0.7-2.3 micrometer regions. The Airborne Visible/Infrared Imaging Spectrometer (AVIRIS) is calibrated in the laboratory to determine the wavelength position and full-width-half-maximum (FWHM) response for each of the 224 channels. The accuracies are limited by the quality of the monochromator used as a source. The accuracies vary from plus or minus to plus or minus 1.5 nm depending on the wavelength region, in general decreasing with increasing wavelength. Green et al. make corrections to the wavelength calibrations by using the known positions of 14 atmospheric absorption features throughout the 0.4-2.5 micrometer wavelength region. These features, having varying width and intensity, were matched to the MODTRAN model with a non-linear least squares fitting algorithm. A complete calibration was developed for all 224 channels by interpolation. Instrument calibration cannot be assumed to be stable to 0.1 nm over a flight season given the rigors of thermal cycling and launch and landing loads. The upcoming sensor HYDICE will require a means for in-flight spectral calibration of each scene because the calibration is both temperature and pressure sensitive. In addition, any sensor using a two-dimensional array has the potential for systematic wavelength shifts as a function of cross-track position, commonly called 'smile'. Therefore, a rapid means for calibrating complete images will be required. The following describes a method for determining instrument wavelength calibration using atmospheric absorption features that is efficient enough to be used for entire images on workstations. This study shows the effect of the surface reflectance on the calibration accuracy and the calibration history for the AVIRIS B spectrometer over the 1992 flight season
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